Through its UK subsidiary Fischer Instrumentation GB Ltd, the Helmut Fischer Group is showcasing some of its most versatile instruments for the current economic climate at the Surface World Show 27th-29th October 2009.
Researchers at The University of Nottingham have a new weapon in their arsenal of tools to push back the boundaries of science, engineering, veterinary medicine and archaeology. From soils and sediments, to chunks of pavement, archaeological remains and chocolate bars... the Nanotom, the most advanced 3D X-ray micro Computed Tomography (CT) scanner in the world, will help scientists from a wide variety of departments across the University literally see through solids.
Together with a 115 mm working distance, this ensures the cost-effective SMZ745T is ideal for observation and digital image capture in industrial and biomedical applications. The SMZ745T is ideal for various applications and environments. Electrostatic discharge (ESD) protection is standard and the anti-mould design in the interior of the zoom body allows the microscope to be used in environments where temperature and humidity are high. Optional illumination accessories are available for various applications and tasks.
Hildebrand Gmbh, the German manufacturer of hardness testers for polymers have just released edition 6 of their four language catalogue giving details of their current range of products for the polymer industries.
The mobile metal analyzer is even more flexible, with a smaller and more compact sample probe. SPECTROTEST is now able to tackle two new applications: The measurement of carbon in low alloy steel using arc discharge and the determination of the nitrogen content in duplex steels.
The Eclipse LV150L is the latest addition to Nikon’s renowned LV series of industrial microscopes. Designed especially for episcopic illumination, the LV150L is the ideal, cost-effective instrument for a wide variety of production line applications involving opaque workpieces.
Research and Markets has announced the addition of the "Advanced Techniques for Materials Characterization" report to their offering.
Nowadays, an impressively large number of powerful characterization tech...
The new technical center will provide more local resources and support for this fast paced market. It's an exciting time for us because this is a chance to be even closer to our customers, and show our commitment to customer support after the sal
Appalachian State University's William C. and Ruth Ann Dewel Microscopy Facility has received a $509,620 award from the National Science Foundation to purchase a state-of-the-art transmission electron microscope/scan...
FEI Company (Nasdaq:FEIC), a leading provider of high-resolution imaging and analysis systems, today announced the release of two dedicated scanning electron microscopes (SEMs) and a new software package for automated an...
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