Physicists at New York University have developed a technique to record three-dimensional movies of microscopic systems, such as biological molecules, through holographic video. The work, which is reported in Optics Expre...
Novelx, Inc. was just selected for a prestigious R&D 100 Award for one of the 100 most technologically significant new products in 2009. R&D Magazine recognized the Novelx mySEM® for miniaturizing and driving the cost out of the core technology inside a scanning electron microscope (SEM).
Scientists at DuPont and Lehigh University have refined a technique, first published in 2003, to sort carbon nanotubes using specific sequences of DNA. This technique offers the first demonstration that nanotubes can be ...
A new microscope that views the subatomic universe -- the first of its kind in the world -- is being built for the University of Victoria, Canada, in collaboration with Hitachi High-Technologies.
The new microscope-c...
Applied Materials, Inc. today announced that its Applied SEMVision™ G4 Defect Analysis platform has been honored with the prestigious Editors' Choice Best Product Award by Semiconductor International (SI) magazine.
Infrared Thermography is a technique that can be employed in the plastic industry for process optimization and quality improvement, as well as in the development of new tools. In the thermoplastic injection process, a large amount of information about the transformation process can be collected by taking thermographic images of the recently injected pieces that are still in the mould or that have just been extracted.
The explosion in the number of new fluorescent dyes has opened up exciting new opportunities for life science researchers. However, each requires the microscope system to be equipped with an appropriate excitation laser, a limitation that has greatly restricted their adoption.
The leading event for the microelectronics failure analysis community returns to San Jose to help engineers and technicians identify defects that are costing manufacturers millions of dollars in failed components, repair...
Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has created an application-specific microsite for those responsible for characterizing solar/photovoltaic devices...
Semilab SSM, a division of Semilab, one of the world's largest metrology companies, announced at Semicon West today a new member of its NanoSRP family of metrology products. Designed for small and mid-tier sized semi...
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