Using devices millionths of a meter in size, physicists at the California Institute of Technology (Caltech) have developed a technique to determine the mass of a single molecule, in real time.
Researchers at the University of California, Berkeley, are proving that a camera phone can capture far more than photos of people or pets at play. They have now developed a cell phone microscope, or CellScope, that not o...
Newly published data demonstrate how the Morphologi G3 automated particle characterization system from Malvern Panalytical is being used to examine pollen in support of allergy research.
Veeco Instruments Inc. (Nasdaq: VECO), the leading provider of atomic force microscopes (AFMs) to the nanoscience community, announced today the launch of its Dimension® Icon® P-Series of Atomic Force Microscope Systems. Now, nanoscale researchers with limited budgets will have access to the latest generation of the world’s most utilized and flexible AFM platform.
Canada's National Institute for Nanotechnology will soon be home to a new electron microscopy research and product development centre. The Hitachi Electron Microscopy Products Development Centre (HEMiC) at the Nation...
Physicists at New York University have developed a technique to record three-dimensional movies of microscopic systems, such as biological molecules, through holographic video. The work, which is reported in Optics Expre...
Novelx, Inc. was just selected for a prestigious R&D 100 Award for one of the 100 most technologically significant new products in 2009. R&D Magazine recognized the Novelx mySEM® for miniaturizing and driving the cost out of the core technology inside a scanning electron microscope (SEM).
Scientists at DuPont and Lehigh University have refined a technique, first published in 2003, to sort carbon nanotubes using specific sequences of DNA. This technique offers the first demonstration that nanotubes can be ...
A new microscope that views the subatomic universe -- the first of its kind in the world -- is being built for the University of Victoria, Canada, in collaboration with Hitachi High-Technologies.
The new microscope-c...
Applied Materials, Inc. today announced that its Applied SEMVision™ G4 Defect Analysis platform has been honored with the prestigious Editors' Choice Best Product Award by Semiconductor International (SI) magazine.
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