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A New Standard in Micro Hardness Testers from Shimadzu

TechSearch International President to Keynote at Cascade Microtech's COMPASS 2013 Conference

TechSearch International President to Keynote at Cascade Microtech's COMPASS 2013 Conference

New Low Cost, Long Pulsed SpectraLEDs from HORIBA Scientific

New Low Cost, Long Pulsed SpectraLEDs from HORIBA Scientific

Zwick to Highlight X-Flow Series at K Show in Dusseldorf

Zwick to Highlight X-Flow Series at K Show in Dusseldorf

Bruker Launches Two New Accessories for Electron Microscopy at M&M 2013

Bruker Launches Two New Accessories for Electron Microscopy at M&M 2013

New Synthetic Material with Strength-Building Ability

New Synthetic Material with Strength-Building Ability

New High Temperature Coin Cell Module On MMC 274 Nexus

New High Temperature Coin Cell Module On MMC 274 Nexus

New Lightweight and Crash-Safe Construction Technology for the Auto Industry

New Lightweight and Crash-Safe Construction Technology for the Auto Industry

Advantest Installs V93000 Smart Scale Tester at HiSilicon Technologies

Advantest Installs V93000 Smart Scale Tester at HiSilicon Technologies

STATS ChipPAC Honors Advantest with Best Supplier Award

STATS ChipPAC Honors Advantest with Best Supplier Award

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