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Measurement Specialties Introduces Triaxial DC Accelerometer

Measurement Specialties Introduces Triaxial DC Accelerometer

Keithley Debuts Benchtop Source Measure Unit Instrument with Capacitive Touchscreen GUI

Keithley Debuts Benchtop Source Measure Unit Instrument with Capacitive Touchscreen GUI

SciAps Launch Inspector Scope Handheld Raman Analyzer

SciAps Launch Inspector Scope Handheld Raman Analyzer

Asian Memory Manufacturer Places Order for Nova's Optical CD Metrology Solution

Asian Memory Manufacturer Places Order for Nova's Optical CD Metrology Solution

Lake Shore to Exhibit Materials Characterization Systems at ICNS 2013

Lake Shore to Exhibit Materials Characterization Systems at ICNS 2013

MTS Partners with German-Dutch Wind Tunnels to Deliver World’s Largest Rolling Road System

MTS Partners with German-Dutch Wind Tunnels to Deliver World’s Largest Rolling Road System

Nanometrics’ Atlas II Platform for OCD Metrology Helps SK hynix Improve Memory Device Production

Nanometrics’ Atlas II Platform for OCD Metrology Helps SK hynix Improve Memory Device Production

DoE's HSSL Virtual Nuclear Control Room Aids Duke Energy Project

DoE's HSSL Virtual Nuclear Control Room Aids Duke Energy Project

A New Standard in Micro Hardness Testers from Shimadzu

TechSearch International President to Keynote at Cascade Microtech's COMPASS 2013 Conference

TechSearch International President to Keynote at Cascade Microtech's COMPASS 2013 Conference

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