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New Technology In Grips From Instron

New Technology In Grips From Instron

Siemens Expand Portfolio to Provide Closed-Loop System-Driven Product Development Solutions

ContourGT-X 3D Optical Microscope Recieves over $3million in Orders for Consumer Display Solutions

ContourGT-X 3D Optical Microscope Recieves over $3million in Orders for Consumer Display Solutions

Electronica 2012 to Feature ConTest-1K Tester for Counterfeit Semiconductor Detection

Electronica 2012 to Feature ConTest-1K Tester for Counterfeit Semiconductor Detection

Increased Presence In Germany For Mecmesin

Increased Presence In Germany For Mecmesin

Plasma and Ion Beam Etch and Deposition Systems Get New Upgrade Range

Plasma and Ion Beam Etch and Deposition Systems Get New Upgrade Range

2012 TESTXPO Attracts Over 1,200 Material Test Experts from Across the Globe

2012 TESTXPO Attracts Over 1,200 Material Test Experts from Across the Globe

New Advanced Software for the DELTA Handheld X-ray Fluorescence (XRF) Analyzers from Olympus NDT

New Advanced Software for the DELTA Handheld X-ray Fluorescence (XRF) Analyzers from Olympus NDT

NASA Rover Curiosity Studies Mineralogy of Martian Soil

NASA Rover Curiosity Studies Mineralogy of Martian Soil

CRAIC MINERVA Microspectrometer Control and Analysis Software Windows(TM) 8 Compatible

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