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Innov-X DELTA Handheld XRF Analyzers on Show at ISRI Convention and Expo

Innov-X DELTA Handheld XRF Analyzers on Show at ISRI Convention and Expo

PTB Are the Only Metrology Institute Able to Produce Hall Effect Resistance Standards

PTB Are the Only Metrology Institute Able to Produce Hall Effect Resistance Standards

Oxford Instruments to Showcase MQC Benchtop NMR Analyzers at AOCS Annual Meeting

Oxford Instruments to Showcase MQC Benchtop NMR Analyzers at AOCS Annual Meeting

New Way to Characterize Wetting is Much More Accurate

New Way to Characterize Wetting is Much More Accurate

Bruker to Supply Large Sample AFM to NIST

Bruker to Supply Large Sample AFM to NIST

FEI Introduces A New High Resolution SEM

Nanometrics Delivers Metrology System for Semiconductor Wafer Manufacturer

Keithley Release Tutorial CD on Electrical Test and Measurement

Fischer Instrumentation to Host Coating Thickness and Materials Analysis Seminar

Fischer Instrumentation to Host Coating Thickness and Materials Analysis Seminar

XYZ Piezo Stage for Micromanufacturing, Nanomanipulation and Microscopy

XYZ Piezo Stage for Micromanufacturing, Nanomanipulation and Microscopy

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