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Bruker Introduce New Benchtop EDXRF Spectrometer at Analytica

Bruker Introduce New Benchtop EDXRF Spectrometer at Analytica

At Analytica 2010, Bruker AXS today launches its significantly enhanced S2 RANGER™ energy dispersive X-ray fluorescence (EDXRF) spectrometer with the new, maintenance-free 4th-generation XFlash® LE silicon drift detector (SDD).

From Bruker Nano Surfaces and Metrology 23 Mar 2010

Next Generation D8 Discover XRD System Released at Analytica

Next Generation D8 Discover XRD System Released at Analytica

At Analytica 2010, Bruker AXS, the market leader in X-Ray Diffraction (XRD), introduces its next-generation D8 DISCOVER™ diffraction system for advanced materials research.

From Bruker Nano Surfaces and Metrology 23 Mar 2010

Bruker Unleash A Host of New Products at Analytica

At Analytica 2010, Bruker Corporation (NASDAQ: BRKR) today announces launches of numerous novel scientific instruments and software capabilities, as well as high-performance analytical solutions for applied markets and i...

From Bruker Nano Surfaces and Metrology 23 Mar 2010

New FT-NMR Spectrometer is within Reach of All Chemists

New FT-NMR Spectrometer is within Reach of All Chemists

Bruker BioSpin announces the new Fourier 300, an innovative, easy-to-use 300 MHz high-resolution spectrometer that brings Fourier transform (FT) Nuclear Magnetic Resonance (NMR) spectroscopy within every chemist’s reach.

From Bruker Nano Surfaces and Metrology 23 Mar 2010

Bruker Daltronics Introduce Entry Level amaZon Ion Trap Mass Spectrometer

Bruker Daltronics Introduce Entry Level amaZon Ion Trap Mass Spectrometer

Bruker Daltonics today announces the newest model in its successful amaZon™ ion trap mass spectrometry product line, the entry level amaZon SL. It builds upon Bruker’s long-standing expertise in high-performance ion trap technologies, and is designed to enhance efficiency for laboratories involved with applications including structural confirmation, compound screening and identification, process and general synthesis control, as well as metabolite identification.

From Bruker Nano Surfaces and Metrology 23 Mar 2010

WITec Extends alpha300 Microscope Range to Suit Customer Requirements

WITec introduces a line extension of the alpha300 microscope series. Building on the system's inherent modularity, WITec has added several new microscope versions in order to meet all the diverse and multi-faceted cu...

From WITec GmbH 23 Mar 2010

Netzsch Laser Flash Analysis Now Available up to 2800°C

Netzsch Laser Flash Analysis Now Available up to 2800°C

For more than a decade, the NETZSCH LFA 427 has been known as one of the most versatile and precise measuring systems in Laser Flash Analysis. Until recently, the temperature range of the LFA 427 had been restricted to a maximum of 2000°C. Now as of 2010, a new version is available which allows measurements up to 2800°C.

From NETZSCH-Gerätebau GmbH 22 Mar 2010

Veeco to Host Seeing at the Nanoscale VIII Conference

Veeco to Host Seeing at the Nanoscale VIII Conference

Veeco Instruments Inc. (Nasdaq: VECO), the leading provider of atomic force microscopes (AFMs) to the nanoscience community, announced today that it will host the "Seeing at the Nanoscale VIII" conference at the Congress Center, Basel, Switzerland, August 30-September 1, 2010.

From Veeco 22 Mar 2010

Malvern Experts Demonstrate How Dynamic Particle Image Analysis for Sub-Visible Particulates

Malvern Experts Demonstrate How Dynamic Particle Image Analysis for Sub-Visible Particulates

Specialists at Malvern Panalytical have demonstrated the application of dynamic particle image analysis to the measurement of sub-visible particulates in biological therapeutics, using the Sysmex FPIA-3000 particle characterization system.

From Malvern Panalytical 18 Mar 2010

Check Out Micromeritics Latest Particle Characterization Equipment at Analytica

Check Out Micromeritics Latest Particle Characterization Equipment at Analytica

Analytica, March 23 through 26, 2010, at the Munich Trade Fair Centre, has developed into one of world’s largest trade fairs for laboratory technology, analysis, and biotechnology. Micromeritics, located in Halle A1, Stand 121 will introduce significant developments in material characterization instrumentation.

From Micromeritics Instrument Corporation 18 Mar 2010

The Current State of the Global Semiconductor Market

The Current State of the Global Semiconductor Market

The global semiconductor market has entered an exciting period. Demand for chip technology is both driving the industry as well as hindering it, with current chip shortages predicted to last for some time. Current trends will likely shape the future of the industry, which is set to continue to show

How are Graphene Batteries Made?

How are Graphene Batteries Made?

The primary distinction between graphene-based batteries and solid-state batteries lies in the composition of either electrode. Although the cathode is commonly changed, carbon allotropes can also be employed in fabricating anodes.

What Role Will The IoT Play In The Electric Vehicle Industry?

What Role Will The IoT Play In The Electric Vehicle Industry?

In recent years, the IoT is rapidly being introduced into almost all sectors, but it has particular importance in the EV industry.

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