Scientists in Australia are reporting the first use of ordinary cotton thread and sewing needles to literally stitch together a microfluidic analytical device - microscopic technology that can transport fluids for medical tests and other purposes in a lab-on-a-chip.
Kobe Steel, Ltd. announces that its new large-capacity compressor test facility has begun operations at the company's Takasago Works in Hyogo Prefecture in western Japan.
Test facilities are essential to confirm ...
CRAIC Technologies is proud to introduce the Perfect Vision for Science™: the flagship 20/20™ UV-visible-NIR microspectrophotometer: an instrument capable of spectroscopy of microscopic samples.
Nortest are pleased to announce that they are now the UK representatives for Lambient Technologies a relatively new US manufacturer of dielectric cure monitoring systems for thermoset materials.
Phenom-World BV announces the launch of a new collection of sample holders and inserts for the Phenom™ desktop scanning electron microscope (SEM). The new holders increase the range of possible samples while maintaining the Phenom’s market-leading time to image. Quick and easy sample loading ensures faster time to data.
Scientists at SINTEF/NTNU and the University of Oslo have been awarded NOK 25 million by the Research Council of Norway for investments in equipment for surface analysis.
"This will be one of the biggest and mos...
Solvay Pharmaceuticals Inc. (Marietta, GA, USA) was the first company in the United States to install the innovative Morphologi G3 image analysis-based particle characterization system from Malvern Panalytical. They have since taken full advantage of the system’s ability to generate comprehensive particle shape as well as size information.
Scientists of the research group of Prof. Dr. Alfred Meixner and Dr. Dai Zhang from the Institute of Physical and Theoretical Chemistry at the University of Tübingen have developed a near-field microscope that can measure the optical properties of e. g. semiconductor thin films with a spatial resolution and sensitivity long thought unachievable due to fundamental physical laws (diffraction limit).
Hiden Analytical introduce their Transient MS system specifically designed for the analysis of fast transient gas events at pressures near atmosphere. The compact benchtop system is founded on the Hiden HPR-20 QIC series gas analysers and features a purpose-designed fast response capillary inlet and the HAL/3F PIC mass spectrometer with pulse ion counting detector.
The installation of an advanced imaging tool, a JEOL Electron Probe Microanalyzer (EPMA), will expand research and educational opportunities for students, faculty, and industry in southeastern North Carolina. In January, JEOL completed the installation of its new generation of EPMA, also known as a microprobe, at the Southeastern North Carolina Regional Microanalytical and Imaging Center.
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