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Applied Materials Launch New Imaging System Increasing Lithography Productivity

High Speed, High Accuracy 3D Surface Analysis of Materials with the Axio CSM 700

High Speed, High Accuracy 3D Surface Analysis of Materials with the Axio CSM 700

Keithley Introduce New Characterization and Curve Tracer Software for Component Test Applications

Keithley Introduce New Characterization and Curve Tracer Software for Component Test Applications

BASF and OSRAM New High Efficiency White OLED Meet International Energy Star SSL Standard

Photon Force to Drive Nanomachines for Spacecraft Sails

Photon Force to Drive Nanomachines for Spacecraft Sails

NJIT to Help Bring Technologies from the Lab to the Marketplace

NIST Propose New, Economical Method for Light-Emitting Diode (LED) Manufacturing Standard

NIST Propose New, Economical Method for Light-Emitting Diode (LED) Manufacturing Standard

NIST Proves Existence of Key Magnetic Electronic Property of Specially Built Semiconductor Devices

NIST Proves Existence of Key Magnetic Electronic Property of Specially Built Semiconductor Devices

NIST Demonstrate Method for Measuring Stress/Strain Levels of Semiconductors at the Nanoscale

NIST Demonstrate Method for Measuring Stress/Strain Levels of Semiconductors at the Nanoscale

Researchers Create Electrical Wires Based on Protein Fibres Encased in Plastic

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