Aug 6 2008
Bruker AXS, in cooperation with The Microbeam Analysis Society, is proud to announce this year’s winner of the Duncumb Award for Excellence in Microanalysis. The award is presented to a person that has made significant contributions over their career to the field of microanalysis, in the advancement of the science and practice as well as in education and service to the microanalysis community.
The award, sponsored by Bruker AXS Microanalysis, will be presented at the MAS Presidential Happenings at the Microscopy and Microanalysis 2008 meeting in Albuquerque. The Duncumb Award honors the seminal contributions to the field of microanalysis made by Peter Duncumb. Peter developed x-ray mapping more than 50 years ago and was also instrumental in the development of analytical electron microscopy.
This year, Bruker is proud to announce that the Duncumb Award for Excellence in Microanalysis is awarded to Professor Joseph Goldstein of UMASS Amherst. Dr. Goldstein is a scientist, educator and administrator internationally known for his work in the development of X-ray techniques in electron microscopy to determine the chemistry of small regions of solid materials, ranging from cubic micrometers to cubic nanometers, and in the field of meteoritics, the study of meteorites and other extraterrestrial materials. Working with colleagues, he has developed methodologies and instrumentation for electron microscopes to improve spatial resolution, to minimize the effects of spurious radiation, and to improve light element and trace element analysis, and used these techniques to measure diffusion coefficients and phase diagrams, to study phase growth and ternary diffusion effects in iron base alloys and various diffusion coatings, and to understand the metal phases in meteorites and lunar samples. Dr. Goldstein has written over 200 technical papers. He has been awarded the Presidential Science Award of the Microbeam Analysis Society and the Leonard Medal of the Meteoritical Society.
Joe Goldstein has shown active leadership in his fields of study. He founded the Lehigh Microscopy School, the most influential and comprehensive education program in electron microscopy and microanalysis, and has co-authored textbooks that have become the recognized standards in the field. As a university administrator, he has overseen the development of several major research centers, the improvement of undergraduate engineering curricula, and the promotion of information technology education. He has served as president of the Microbeam Analysis Society and The Meteoritical Society.
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