Posted in | News | Nanomaterials and Nanotechnology | Materials Testing | Materials Research

Ambios Non-Contact Optical Interferometer Available from LOT Oriel

Jun 15 2009

The Xi-100 Non-Contact Optical Interferometer from Ambios Technology quickly and accurately measures the 3D topography of surfaces at the nanometer level. It is designed for the researcher who is interested in getting fast, repeatable date from an instrument that is not encumbered by unneeded levels of complication. Rapidly image areas in scale from microns to millimeters and the only instrument adjustments are sample position and focus.

Main features:

  • Fast, non-destructive, 3-dimensional measurements
  • Point and shoot operation
  • High resolution, accuracy, and repeatability on smooth or rough surfaces
  • Highly affordable

The Ambios Xi-100 Non-Contact Optical Interferometer is avilable from LOT Oriel.

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