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Results 161 - 170 of 1110 for Mass Spectrometer
  • News - 16 May 2007
    The Hiden HPR-40 research-grade mass spectrometer system provides for real-time analysis of dissolved gases and vapours, both single and multiple species, in aqueous solutions. Gas/vapour permeable...
  • News - 6 Mar 2007
    Purdue University researchers have created a handheld sensing system its creators liken to Star Trek's "tricorder" used to analyze the chemical components of alien worlds. But the system...
  • News - 25 Jul 2006
    Thermo Electron Corporation, the world leader in analytical instruments, today announced it has acquired GV Instruments Limited of Manchester, UK, a manufacturer of isotope ratio mass spectrometers...
  • News - 2 Feb 2006
    Hiden Analytical announce the introduction of the latest new feature for the CATLAB Microreactor / Mass Spectrometers - the pulse chemisorption operating mode. An integrated pulse valve allows single...
  • Equipment
    The CAMECA NanoSIMS 50 is a unique ion microprobe optimizing SIMS analysis performance at high lateral resolution. It is based on a coaxial optical design of the ion gun and the Secondary ion...
  • Equipment
    The CAMECA SC Ultra has been specifically designed to meet the increasing needs for dynamic SIMS measurements in advanced semiconductors. The design of the CAMECA SC Ultra is quite unique: along with...
  • Equipment
    The IMS 1280 is based on a double focusing mass spectrometer with a large radius magnetic sector. The secondary ion optics has been optimized to work at full transmission up to 6,000 mass resolving...
  • Supplier Profile
    Bruker Optics, part of the Bruker Corporation is one of the world’s leading manufacturer and worldwide supplier of Fourier Transform Infrared, Near Infrared and Raman spectrometers. Bruker...
  • Supplier Profile
    m-oem is a global brand representing the four companies Innovative Photonic Solutions (IPS), B&W Tek, DropSens, and Metroglas. We provide off-the-shelf precision optical components,...
  • Equipment
    The chemical formation of a surface is often monitored using Secondary Ion Mass Spectrometry (SIMS), which locates and identifies trace elements. This process must be carried out using extremely...

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