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  • Equipment
    The Phantom III RIE (reactive ion etch system) is designed to supply research and failure analysis laboratories with state-of-the-art plasma etch capability using single wafers, dies or parts using...
  • Webinar - 9 Jun 2022
    This webinar forum will present different approaches to maintaining sample integrity during electron microscopy studies and will feature a discussion on future directions in this field, for example...
  • Book
    High Temperature Coatings demonstrates how to counteract the thermal effects of the rapid corrosion and degradation of exposed materials and equipment that can occur under high operating temperatures....
  • Book
    In Science of Microscopy, comprehensive reviews set innovations in the context of microscopy today. Each contribution presents a form of microscopy or occasionally a microscopic technique, and...
  • Book
    An Introduction to Rubber Technology is the ideal basic guide for anyone who is about to start working with rubber. This handbook has information about every aspect of using rubber from the initial...
  • Article - 8 May 2001
    Plain carbon steels' properties are to some degree controlled by carbon content. The properties of the various carbon composition steel families are outlined.
  • Article - 11 Apr 2001
    Shape memory polyethylenes can be used for pipe repairs without the need for removing large sections of pipe or major excavations. This article describes how it the process works and the materials...
  • Equipment
    The IM10T-30 drop weight impact tester from Imatek features impact energy up to 900J requiring a floor-to-ceiling height of 5.5m (5kg to 30kg impact mass at 1.0m/s to 7.7m/s impact velocity)
  • Report
    NanoMarkets believes that the transparent display market will dramatically expand. Smart glasses such as augmented reality and Google Glass applications have focused attention on displays that can...
  • Equipment
    This article details the capabilities of the X-Supreme8000, a benchtop bulk XRF analyzer for benchtop bulk analysis (XRF).

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