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Results 21 - 30 of 470 for Scanning Probe Microscopy
  • JEOL USA, Inc.
    Supplier Profile
    JEOL USA is a wholly-owned subsidiary of JEOL Ltd in Japan, a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core...
  • Photothermal Spectroscopy Corp
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    Photothermal Spectroscopy Corp (PSC) is a Santa Barbara, CA, based scientific equipment company that pioneered sub-micron IR microscopy and spectroscopy. PSC’s vision is to enable the power of...
  • KLA Instruments™
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    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
  • Thermo Fisher Scientific – Materials & Structural Analysis
    Supplier Profile
    Thermo Fisher Materials and Structural Analysis products give you outstanding capabilities in materials science research and development. Driving innovation and productivity, our portfolio of...
  • Polytec
    Supplier Profile
    At Polytec, we specialize in advanced optical measurement systems and cutting-edge testing services, all tailored to meet your unique needs. Our focus is your success. With a dedicated commitment to...
  • Evident Corporation - Industrial Microscopy
    Supplier Profile
    The industrial microscope business features a lineup of innovative test, measurement, inspection, and imaging instruments used for quality control, R&D, and other technical applications. Evident,...
  • HORIBA Scientific UK
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    HORIBA UK provides an extensive array of instruments and systems for applications ranging from Automotive R&D, Process and Environmental monitoring, In-vitro Medical diagnostics, Semiconductor...
  • Probing Solid/Liquid Interfaces in Lithium-Ion Batteries Using Scanning Probe Microscopy
    Article - 5 Jun 2020
    Improving the performance of Lithium-ion batteries relies on a deep understanding of how the materials that make up the device function during use. Scanning Probe Microscopy (SPM)-based PeakForce TUNA...
  • What is Scanning Probe Microscopy (SPM)?
    Article - 4 Sep 2018
    The SPM method is a form of microscopy that involves imaging surface structures at atomic (height) resolution without ruining the sample.
  • XEI Scientific
    Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...

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The Current State of the Global Semiconductor Market

The Current State of the Global Semiconductor Market

The global semiconductor market has entered an exciting period. Demand for chip technology is both driving the industry as well as hindering it, with current chip shortages predicted to last for some time. Current trends will likely shape the future of the industry, which is set to continue to show

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The primary distinction between graphene-based batteries and solid-state batteries lies in the composition of either electrode. Although the cathode is commonly changed, carbon allotropes can also be employed in fabricating anodes.

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