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Results 41 - 50 of 301 for detection system
  • Supplier Profile
    m-oem is a global brand representing the four companies Innovative Photonic Solutions (IPS), B&W Tek, DropSens, and Metroglas. We provide off-the-shelf precision optical components,...
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    SilcoTek® is the world’s leading provider of coatings applied by chemical vapor deposition (CVD).  Whether in the laboratory, plant, or field, SilcoTek’s patented coating...
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    JEOL USA is a wholly-owned subsidiary of JEOL Ltd in Japan, a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core...
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    In 2020, the leading companies for particle characterization, RETSCH Technology, Microtrac, and MicrotracBEL united and became one powerful brand: Microtrac. In 2023, the French company Formulaction,...
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    TOFWERK is making the world a cleaner place through innovative solutions for chemical analysis. Our scientists and engineers design, manufacture, and optimize high performance mass spectrometers for...
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    Entegris is a leader in specialty chemicals and advanced materials solutions for the microelectronics industry. In 2018, Entegris acquired Particle Sizing Systems, a company focused on particle sizing...
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    Zurich Instruments is a test and measurement company based in Zurich, Switzerland, developing and selling measurement instruments and delivering customer support in key markets around the world,...
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    FLIR was founded in 1978, originally providing infrared imaging systems that were installed on vehicles for use in conducting energy audits. We later expanded our focus to other applications and...
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    DECTRIS develops and manufactures the most accurate X-ray and electron cameras to spark scientific breakthroughs around the world. While photographic cameras capture visible light, DECTRIS cameras...
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    Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale. Used on electron microscopes and ion-beam systems,...

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