Dimension IconIR - For Photothermal AFM-IR

Bruker's Dimension IconIR, a large-sample system, merges nanoscale infrared (IR) spectroscopy with scanning probe microscopy (SPM) to provide unmatched spectroscopy, imaging, and property mapping performance on a single platform.

This system encapsulates decades of research and technological advancements and features high-resolution chemical imaging with monolayer sensitivity. Its large-sample architecture offers ultimate sample flexibility while maintaining all the industry-best atomic force microscopy (AFM) measurement capabilities of the Dimension Icon^®.

The Dimension IconIR leverages Bruker-exclusive PeakForce Tapping^® for nanoscale property mapping and proprietary nanoIR spectroscopy technology. This combination enables correlative microscopy that supports comprehensive nanochemical, nanoelectrical, and nanomechanical characterization of materials and active nanoscale systems within electrical or chemically reactive environments.

Correlated nanoscale property mapping showing nanoelectrical (PF-KPFM, top), nanothermal (SThM, middle), and nanochemical (AFM-IR, bottom) images of carbon fibers embedded in epoxy resin. Image Credit: Bruker Nano Surfaces and Metrology

Only Dimension IconIR Delivers

• Correlative chemical imaging with PeakForce Tapping nanomechanical and nanoelectrical modes
• High-performance nanoIR spectroscopy with FT-IR correlation, <10 nm chemical resolution, and monolayer sensitivity
• Highest Performance AFM imaging and ultimate sample flexibility
• The widest range of applications, accessories and AFM modes

Highest Performance NanoIR Spectroscopy

High-quality resonance-enhanced AFM-IR spectra collected at different sites on a PS-LDPE polymer blend, illustrating a high degree of material sensitivity and deeper insight into nanoscale material properties. Image Credit: Bruker Nano Surfaces and Metrology

With its patented, unique suite of nanoIR modes, Bruker leads the way in AFM-IR-based nanoIR spectroscopy, offering the most accurate, fast, repeatable, and high-performance spectra that correlate to FT-IR. The variety of modes available enables both industrial and academic users to measure a wide range of samples.

IconIR Delivers:

• The system delivers the highest performance, producing rich, detailed spectra with FT-IR correlation capable of achieving single molecular spectroscopy.
• Resonance-enhanced AFM-IR is the preferred technique within the nanoIR community, with the largest number of scientific publications to support its use.

Highest-Resolution Chemical Imaging

High-resolution chemical imaging of PS-b-PMMA block copolymer in Tapping AFM-IR mode showing sample topography (a); IR images at 1730 (b); and 1492 cm^-1 (c) highlighting PMMA and PS, respectively. The yellow arrows in panel (b) indicate chemical resolution <10 nm. The overlay image (d) captures the composition map. Image Credit: Bruker Nano Surfaces and Metrology

The Icon's industry-leading AFM performance has significantly enhanced the spatial resolution capabilities of nanoIR technology, establishing it as the ultimate nanoscale chemical imaging system. It provides sub-10 nm chemical resolution and monolayer sensitivity.

Bruker’s patented Tapping AFM-IR imaging is widely used across a range of soft samples, consistently delivering reliable, high-quality data suitable for publication.

IconIR Provides:

• <10 nm chemical spatial resolution for imaging over a broad range of sample types
• Monolayer sensitivity for imaging of thin films and biological structures

Specifications

Source: Bruker Nano Surfaces and Metrology