The FlexSEM II VP-SEM is intended for researchers and lab managers who want the capabilities of a standard SEM but prefer a more compact and user-friendly tabletop form.
Thanks to high-resolution imaging and various adaptive features, such as incorporated EDS analysis, it provides robust imaging performance for both experienced professionals and newbies to electron microscopy. The instrument’s adaptable configuration makes it an excellent choice for a variety of scientific settings.
Whether working with biological specimens, materials research, or multipurpose imaging, the FlexSEM II allows users to swiftly and simply analyze high-quality images.
Image Credit: Hitachi High-Tech Europe
Product Features
- Compact and adaptable design
- High-resolution imaging
- Adaptable vacuum modes
- Automated, user-friendly operation
- 5-axis sample stage
Specifications
- High-vacuum mode: Yes
- Variable pressure: Yes, up to 100 Pa
- SE Resolution: 4 nm at 20 kV
- Electron source: Thermal Tungsten Emitter
- Sample size: Up to 153 Ø, 40 mm (H)
Features and Benefits
Compact and Flexible Design
Image Credit: Hitachi High-Tech Europe
The FlexSEM II’s compact design (450 mm wide) allows it to fit comfortably in limited locations while providing the expected performance of a full-sized SEM. Its modular design allows you to position components wherever they are most convenient, providing versatile installation possibilities.
This adaptability implies that the system can easily be integrated into various locations, including tiny labs, offices, and mobile configurations. It operates on a regular power outlet and requires only an external roughing pump. It eliminates the need for specialist equipment and makes high-quality photography more accessible to various users.
Adaptable Vacuum Modes
Image Credit: Hitachi High-Tech Europe
The FlexSEM II includes a variable pressure imaging mode as standard, as well as high-vacuum, which allows observations under 100 Pa chamber pressure. This function makes it easier to image non-conductive materials by eliminating the need for significant sample preparation - charge-up elimination is as simple as a mouse click.
With these flexible vacuum options, you can easily handle a variety of specimen types, including sensitive or non-conductive materials, so you get more accurate and reliable imaging results.
High-Resolution Imaging
Image Credit: Hitachi High-Tech Europe
The electron optical system is powered by a user-exchangeable tungsten hairpin filament with a longer lifetime thanks to dynamic saturation tuning. At 20 kV accelerating voltage, users achieve excellent image quality with SE resolution of up to 4 nm.
Besides a high-vacuum SE detector the FlexSEM II also features a sensitive 5-segment BSE detector, allowing for multiple image impressions in high and low vacuum modes.
The detector ensemble is completed by an optional SE detector with a low vacuum mode. All of this optimizes the FlexSEM for difficult imaging tasks at both higher and surface-sensitive low accelerating voltages.
The high resolution and full detector set allows users to record precise features of various samples, making it suited for everything from biological specimens to advanced materials research, all while maintaining image clarity.
5-Axis Sample Stage
Image Credit: Hitachi High-Tech Europe
The eucentric 5-axis specimen stage provides multi-perspective imaging. It is also supplemented by a light-optical specimen navigation image in which the feature-of-interest is easily accessible by a quick mouse click on the target.
The specimen chamber can handle samples up to 153 mm in diameter and 40 mm in height. The motorized X, Y, and R axes enable users to image a whole circle with a 64 mm diameter.
A constantly applied anti-collision model ensures safe specimen navigation, with the Z and T axes being sensor-supervised but manually operated. Users will receive a visual and acoustic warning if a potentially risky operation occurs on any stage axis.
This adaptability enables extensive investigation of various sample locations and perspectives, allowing researchers to quickly obtain the best image for analysis. Managing larger or multiple specimens simultaneously increases workflow efficiency.
Automated, User-Friendly Operation
Image Credit: Hitachi High-Tech Europe
The FlexSEM II's graphical user interface is intuitive, well-organized, and simple to use.
A trackball for stage control and an operating knob panel that provides manual access to the most regularly utilized SEM functions help to ensure efficient operation.
High-quality imaging is made easy with dependable auto-functions like as auto-focus, auto-brightness, and contrast adjustments that modify settings in seconds.
Full workflow automation of repetitive operations is possible using optional functions such as Python scripting or the EM-Flow Creator, which has an easy, graphics-oriented workflow configuration.
Optional Accessories for Expanded Functionality
Image Credit: Hitachi High-Tech Europe
For users who require more sophisticated capabilities, the FlexSEM II can be fitted with accessories like EDX systems from Oxford Instruments or Bruker. These systems offer in-depth elemental analysis.
Additional software choices enable 3D reconstruction, particle/pore/fiber analysis, and other specialized imaging tasks.
These enhancements broaden the system's use, allowing it to adapt to the changing needs of various research and industrial applications while delivering a customized solution for each user’s individual needs.
Applications Gallery
Pharmaceuticals
Pharmaceutical sample. 4.00 kV 5.6 mm x7.50k SE. Image Credit: Hitachi High-Tech Europe
Environmental
Argon-ion milled paper cross-section. 10.00 kV 5.8 mm x2.70k BSE 30 Pa. Image Credit: Hitachi High-Tech Europe
Energy
NMC cathode cross-section. 3.00 kV 4.9 mm x6.00k BSE. Image Credit: Hitachi High-Tech Europe
NMC active material. 7.00 kV 6.2 mm x4.50k SE. Image Credit: Hitachi High-Tech Europe
Manufacturing
Cement. 3.00 kV x15.0k SE. Image Credit: Hitachi High-Tech Europe
Wire bonding. 15.0 kV x500 UVD 60 Pa. Image Credit: Hitachi High-Tech Europe
Specifications
Source: Hitachi High-Tech Europe
| . |
. |
| Type |
Scanning Electron Microscope, high and low vacuum modes |
| Applications |
Laboratory, Materials Research, Biological, Multipurpose |
| Configuration |
Benchtop, Compact, Floor-Standing |
| Electron Source |
Thermionic |
| Other Characteristics |
High-Resolution |
| Resolution |
4 nm SE @ 20 kV |