Nanomaterials and Nanotechnology News

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New Strain Measurement Methods Tests Flexibility of Semiconductors

Carl Zeiss Receives Prestigious R+D Award for One of the 100 Most Technologically Significant New Products in 2008

Scientists Overcome Major Challenges Facing Solar Energy

Scientists Overcome Major Challenges Facing Solar Energy

New Software Package Allows Semiconductor Manufacturers to Analyze Silicon Strain in Shorter Times

New Software Package Allows Semiconductor Manufacturers to Analyze Silicon Strain in Shorter Times

Surrey Nanosystems Extend Thin Film Deposition Capabilities at NIMP

New Nanoscale Torsion Resonator Capable of Measuring Twisting or Torque in Metallic Nanowire

Development of New Nanocluster Help Boost Semiconductor Capabilities

Development of New Nanocluster Help Boost Semiconductor Capabilities

Scietists Develop New Method to Take Closer Look at Electron Arrangement Inside Molecules

Researchers Use LayTec Metrology System to Develop Crack-Free Layers for HEMTs

Researchers Use LayTec Metrology System to Develop Crack-Free Layers for HEMTs

Chinese Researchers Developing First DNA Tweezers

Chinese Researchers Developing First DNA Tweezers

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