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Malvern Particle Characterization System Finds Application in Allergy Research

Malvern Particle Characterization System Finds Application in Allergy Research

EPMA Launch Project on Ultrasonic Fatigue Testing of Hardmetals in the Gigacycle Regime'

Veeco Launch New Series of Atomic Force Microscopes

Veeco Launch New Series of Atomic Force Microscopes

Materials Research Projects at ORNL Win 8 R+D100 Awards

Canada's National Institute for Nanotechnology to House Electron Microscope R+D Centre

Low Cost SEM Wins R+D100 Award

Low Cost SEM Wins R+D100 Award

PALM MicroTweezer Force Measurement module Makes Microscopic Manipulation Easier

PALM MicroTweezer Force Measurement module Makes Microscopic Manipulation Easier

Carbon Nanotubes Sorted by Size, Property and Chirality for the First Time

STEHM Microscope will Provide Views into the Subatomic Universe

Defect Analysis Platform for Semiconductor Manufacturers Wins Award

Defect Analysis Platform for Semiconductor Manufacturers Wins Award

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