CyberOptics, a provider of process yield and throughput improvement solutions for the worldwide electronics assembly and semiconductor equipment markets, announced that it will exhibit the QX100 automated optical inspection (AOI) tabletop system powered by AI2 (Autonomous Image Interpretation), an advanced image analysis software, at the JISSO PROTEC 2012 expo. The event will be held from June 13 to 15, 2012 in Tokyo, Japan.
The company will also feature a range of in-line AOI and advanced solder paste inspection (SPI) systems. A prototype model of the QX100i inline AOI system will also be displayed at the event. The QX100 system includes Strobed Inspection Module (SIM), an exclusive image acquisition technology of CyberOptics and it combines the flexibility of a tabletop system with a performance of an in-line system. It is capable of reviewing component sizes down to 01005. AI2, a robust statistical modeling engine, offers excellent defect detection capabilities, enhanced clarity of defect identification and extremely low false call rates. The AI2 technology enables simpler and faster programming and helps users to setup models in an easier way. The QX100 AOI tabletop inspection system is suitable for high-mix environments.
The company’s leading 3-D SPI system, SE500, will also be featured at the JISSO PROTEC. It is used to inspect the complex assemblies at a speed greater than 80cm2/sec without affecting repeatability and measurement accuracy. Another product on display will be CyberOptics’ QX500 AOI system, which offers high-speed inspection along with superior defect coverage and a very low false call rate.