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Results 131 - 140 of 646 for Afm
  • Veeco Sell Automated 3D AFM to Korean Semiconductor Manufacturer
    News - 2 Oct 2008
    Veeco Instruments Inc., announced today that its new InSight(TM) 3D Automated Atomic Force Microscope (3DAFM) Platform has been accepted by a key global semiconductor customer for Critical Dimension...
  • AFM Measures Nanostructures on Mars
    News - 12 Jul 2008
    For the first time ever, nanostructures have been measured on another planet. On July 9, the NASA "Phoenix" Mars Probe recorded images with nanometer resolution (one nanometer roughly...
  • Global Semiconductor Maker Approves Veeco's 3D AFM
    News - 30 Apr 2008
    Veeco Instruments Inc., announced today that its new InSight(TM) 3D Automated Atomic Force Microscope (3DAFM) Platform has been accepted by a key global semiconductor customer. The InSight is the...
  • Diamond-Like-Carbon Coated AFM Tips Now Available from Budget Sensors
    News - 9 Apr 2008
    BudgetSensors, a Bulgarian manufacturer of silicon and silicon nitride probes, as well as AFM accessories for Atomic Force Microscope (AFM), announces the introduction of a range of...
  • Veeco AFM Chosen for Cuttting Edge Research on Spintronics
    News - 3 Apr 2008
    Veeco Instruments Inc., a leading provider of instrumentation to the nanoscience community, announced today that the prestigious 'Unite mixte de Physique' (UMP), a joint laboratory between the...
  • Electrochemical Scanning Probe Microscopy: Increased Control for MultiMode AFMs
    Equipment
    The MultiMode® Atomic Force Microscopes (AFMs) systems from Bruker are the most productive electrochemical (EC) systems that are commercially available today, with more peer-reviewed EC publications...
  • LatticeGear
    Supplier Profile
    LatticeGear is passionate about sample preparation and the under appreciated art of scribing and cleaving.   They help their customers get to the business of imaging and analysis faster. Their...
  • Zurich Instruments
    Supplier Profile
    Zurich Instruments is a test and measurement company based in Zurich, Switzerland, developing and selling measurement instruments and delivering customer support in key markets around the world,...
  • Generating Color Images with Atomic Force Microscopy
    Article - 7 Jan 2020
    While an optical microscope allows users to visualize microscopic structures using magnification and visual light, an atomic force microscope (AFM) can provide information on atomic-scale structures...
  • Can Machine Learning Reduce AFM Uncertainty?
    Article - 13 Jul 2022
    Two studies published in 2022 demonstrate machine learning techniques employed to reduce uncertainty in atomic force microscopy (AFM). Making AFM more accurate with artificial intelligence (AI) could...

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