The ZEISS Xradia 800 Ultra X-Ray microscope helps achieve a spatial resolution as low as 50 nm. It is the best among laboratory-based X-Ray imaging systems. Non-destructive 3D imaging provides unparalleled performance in an ultra-high-resolution lab-based system. This is essential in the cutting-edge research that is currently being conducted.
The innovative Xradia Ultra architecture employs synchrotron-adapted optics to provide X-Ray energy up to 8 keV as well as absorption and phase contrast imaging modes. The Xradia 800 Ultra assists in achieving peerless in situ and 4D capabilities that have been considered essential for analyzing material evolution in recent years.
The limits of X-Ray imaging have been used in a variety of natural resources, industrial applications, life sciences and materials science that are extended by Xradia 800 Ultra.
Highlights
The Xradia 800 Ultra has a resolution of 50 nm, allowing it to see microscopic processes and structures that were previously inaccessible using standard lab-based X-Ray technology.
The use of 8 keV X-Rays provides great penetration and contrast for a variety of materials. This enables users to make a note of structures and materials that are present in their natural state.
The Zernike method has been applied to the ZEISS integrated phase contrast technology, enhancing the visibility of grain boundaries and material interfaces when absorption contrast is low. This allows users to observe nano- and ultra-structures without the need for staining.
The ZEISS Xradia 800 Ultra delivers reliable internal 3D information that would otherwise be only accessible through harmful methods like cross-sectioning. In situ studies can be carried out with ease due to the atmospheric sample environment and large working distance.
Benefits
- Automated image alignment available for tomographic reconstruction
- Absorption and Zernike phase contrast imaging modes are available
- Non-destructive 3D X-Ray imaging enables repeated imaging of the same sample allowing direct observation of microstructural evolution
- Switchable field-of-view varies from 15 to 60 µm
- High resolution down to 50 nm has been retained for imaging of samples inside in situ devices
- The Scout-and-Scan Control System, with a simple workflow-based user interface, is appropriate for the central imaging laboratory, where users may exhibit an extensive range of experience levels
- Develop, make and test scheduled synchrotron experiments in the laboratory to increase the efficiency of restricted availability of synchrotron beam time
ZEISS Xradia 800 Ultra X-Ray Microscope
Crack Propagation and Fracture in Dentin