The Ultra DI 20 Plus particle counter has been meticulously designed and fine-tuned to meet the demands of ultrapure water monitoring on a global scale.
By effectively counting and sizing particles as tiny as 20 nm, the Ultra DI 20 Plus system stands as a benchmark for exceptional particle detection capabilities.
It excels with its high counting efficiency, minor zero-count, consistent performance across various locations and environmental conditions, and the added benefit of not incurring extra costs for an environmental enclosure.
As a result, the UDI 20 Plus provides customers with a dependable and precise solution for liquid optical particle counting.
What sets the Ultra DI-20 Plus apart is its remarkable ability to maintain stable particle measurements within an operating temperature range of 18 to 29 °C, ensuring unparalleled data consistency and alignment between instruments.
This particle counter even offers instrument matching with less than a 20% discrepancy at concentrations exceeding 2 particles per milliliter, a vital requirement frequently demanded by the current semiconductor industry.
This product allows users to place unwavering trust in their ultrapure water (UPW) data, regardless of the specific particle counter unit users utilize.
Users have the freedom to seamlessly interchange particle counters or compare data across different locations with the confidence that the data remains consistent. This comparability extends its benefits from Fabs in the same town to Fabs spanning the globe.
Furthermore, this simplifies the logistics of annual equipment calibration since users can swap instruments within their fleet without causing disruptions or raising questions about data integrity.
The Ultra DI-20 Plus guarantees absolute precision by meticulously regulating the internal environment within the instrument case.
Regardless of where users position the unit, the UDI-20 Plus consistently generates the most accurate and reproducible 20 nm particle data achievable. Moreover, it eliminates the requirement for additional expenses related to purchasing and maintaining an environmental enclosure.
Benefits
- Powerful laser optics and sensors can detect particles as small as 20 nm (9 nm Au).
- Swift sample cleanup reduces the time needed to move from one sample point to another
- Act promptly in response to contamination by utilizing real-time particle measurement
- Effortlessly acquire valuable statistical data for the prompt detection of particle irregularities and efficient troubleshooting
- Eradicates the need for extra expenses associated with acquiring and maintaining an environmental enclosure.
Features
- Unrivaled instrument-to-instrument data stability and alignment achieved through thermally stabilized particle measurements within an operating range of 18 to 29 °C
- Instrument to instrument matching within a 20% tolerance for concentrations of >2 particles per milliliter
- Swap users’ fleet of instruments without causing disruptions or raising doubts about data integrity
- Seamlessly compare UPW system performance across multiple fabs, regardless of environmental conditions, anywhere in the world
- Two distinct counting modes are available:
- High resolution-for pure environments
- High concentration-Suitable for filter challenge tests and less pure settings
- Easily establish direct connections to PLC and SCADA systems using a 4–20 mA interface, and make use of the existing network with Ethernet communication
Applications
- Measuring particle concentration within cutting-edge ultrapure water (UPW) systems
- Evaluating filter efficiency
- Identifying bacterial growth in UPW systems
- Conducting trend analysis at reduced particle concentrations
- Providing uninterrupted system monitoring
- Tracking and alarming for episodic events
Specifications
Source: Particle Measuring Systems
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| Channels |
4 |
| Channel sizes |
20, 50, 70, 100 nm |
| Flow rate (ml/min) |
75 ml/min ± 10% |
| Counting Efficiency |
100% of sampling volume |
| Sample temperature |
59 – 122 °F (15 – 50 °C) 1 |
| Maximum pressure |
100 psi |
| Zero count |
≤ 50 counts/L 2 |
| Exterior surface |
316L Stainless steel |
| Wetted surface materials |
Teflon®, Kel-F®, fused silica, Viton®, 96% Alumina Ceramic, and Simriz® 485 |
| Dimensions (d, w, h) |
20.0 x 16.8 x 14.5 in (50.8 x 42.7 x 36.8 cm) |
| Weight |
71 lb (32.2 kg) |
| Communications |
Ethernet
4-20 mA (5 outputs: 4 particle channels, 1 instrument status)
RS-232 (set up and diagnostics only, no data) |
| Status indicator |
Laser, power, and activity: one (1) tri-color LED |
| Calibration |
Materials used are traceable to National Institute of Standards and Technology (NIST) |
| Electrical Rating |
100 - 240V, 50 - 60 Hz, 5.0 A |
| Fuses |
250 V, 5 x 20 mm, 5.0 A |
| Voltage fluctuation |
AC input voltage fluctuation shall not exceed ± 10% |
| Laser classification |
Class I complies with US21 CFR 1040.10 and EN60825-1.
Internally an enclosed Class IV laser is used per EN60825-1.
Operates with enclosure dorr open or closed |
| Environment |
Temperature: 64.4 – 84 °F (18 – 29 °C)
± 1 °C /hour 3
Humidity, Non-condensing
Maximum altitude: 6,562 ft (2,000 m)
Indoor use only
Pollution degree 2 |
Over-voltage Category II
Ordinary protection (Not protected against harmful ingress of moisture)
Class I environment (Electrical Earth ground from the mains power source to the product input is required for safety) |
Storage and transport
environment |
41 - 113 °F (5 - 45 °C)
5 - 90 % Humidity |
1 For temperatures greater than 122 °F (50 °C), use of a chiller is recommended.
2 Requires optimization by local Particle Measuring Systems service representative.
3 Operating the unit above 29 °C is beyond a manner not specified by the manufacturer, and any risk mitigations provided by the unit may be impaired.