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AXT To Present White Papers on XRD Detectors at AXAA 2014

Olympus NDT and REFLEX Partner to Bring REFLEX XRF Connect and REFLEX HUB to the Minerals Market

Jefferson Lab Develops Three New Neutron Shielding Products

Jefferson Lab Develops Three New Neutron Shielding Products

First-of-its-kind Color Calibration System for Microscopy from Datacolor

Olympus and the Smithsonian Team Up for Q?rius

University of Leuven Collaborates with Nikon Metrology to Apply Computed Tomography for Accurate Analysis of Internal Geometries of Complex Components

University of Leuven Collaborates with Nikon Metrology to Apply Computed Tomography for Accurate Analysis of Internal Geometries of Complex Components

‘Dislocation Controlled Wear in Single Crystal Silicon Carbide’ Study Wins Springer’s Cahn Prize

‘Dislocation Controlled Wear in Single Crystal Silicon Carbide’ Study Wins Springer’s Cahn Prize

The National Physical Laboratory (NPL) Launches New E-Learning Course to Provide Measurement Expertise

The National Physical Laboratory (NPL) Launches New E-Learning Course to Provide Measurement Expertise

Using Ruby Or Diamond Orifices With WARDJet waterjets

Using Ruby Or Diamond Orifices With WARDJet waterjets

Agilent's Award-Winning, Ultrafast Express Test Now Compatible With All G200 Stages and DCM II, XP Heads

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