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Cornell University to Receive the First VersaXRM-520 X-Ray Microscope from Xradia, Inc.

Cornell University to Receive the First VersaXRM-520 X-Ray Microscope from Xradia, Inc.

Enhanced GPC/SEC Analysis for Polymer Research and Development using the Viscotek Viscometer Detector from Malvern

Enhanced GPC/SEC Analysis for Polymer Research and Development using the Viscotek Viscometer Detector from Malvern

Freeman Technology to Highlight the FT4 at Shows Across Asia

New Microspectroscopy and Imaging Software Package by Craic Technologies

New Microspectroscopy and Imaging Software Package by Craic Technologies

Conquer Scientific to Discuss Options of Pre-owned Mass Specs for Laboratories at 2013 ASMS Conference

Conquer Scientific to Discuss Options of Pre-owned Mass Specs for Laboratories at 2013 ASMS Conference

TECHJET Named 2012 International Distributor of the Year By Jet Edge

Dow Corning to Present at IEEE Electronic Components and Technology Conference 2013

New Continuous Mercury Monitoring System by Gasmet

New Continuous Mercury Monitoring System by Gasmet

Agilent Technologies New AFM/Raman Spectroscopy System Provides Nanoscale Material Identification and Analysis

Agilent Technologies New AFM/Raman Spectroscopy System Provides Nanoscale Material Identification and Analysis

'Machining and Machine-tools: Research and Development' - Third in the Woodhead Publishing Reviews

'Machining and Machine-tools: Research and Development' - Third in the Woodhead Publishing Reviews

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