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New Olympus LEXT OLS4100 3D Laser Scanning Microscope for Precision Metrology

New Olympus LEXT OLS4100 3D Laser Scanning Microscope for Precision Metrology

Avomeen Analytical Services Opens New Complex of Multiple Laboratories

Avomeen Analytical Services Opens New Complex of Multiple Laboratories

NIMS Releases Structural Materials Data Sheet Technical Document No. 19

NIMS Releases Structural Materials Data Sheet Technical Document No. 19

Advantest Earns a Place on VLSIresearch’s 10 Best Semiconductor Test Equipment Supplier List

Advantest Earns a Place on VLSIresearch’s 10 Best Semiconductor Test Equipment Supplier List

WAS’ ICP-OES Methodology Provides Simultaneous Qualitative Determination

WAS’ ICP-OES Methodology Provides Simultaneous Qualitative Determination

Uniqsis Develops Mild Nitration Method Using FlowSyn Flow Chemistry System

Uniqsis Develops Mild Nitration Method Using FlowSyn Flow Chemistry System

Dow Corning to Present at IEEE Electronic Components and Technology Conference 2013

New Report on Role of Dimensional Metrology in Medical Device Industry

New Report on Role of Dimensional Metrology in Medical Device Industry

AP Introduces Rub & Buzz and Air Leak Detection Tests for Loudspeakers

AP Introduces Rub & Buzz and Air Leak Detection Tests for Loudspeakers

Porvair Introduces North American Edition of Microplates and Microplate Equipment Catalog

Porvair Introduces North American Edition of Microplates and Microplate Equipment Catalog

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