The Eclipse LV150L is the latest addition to Nikon’s renowned LV series of industrial microscopes. Designed especially for episcopic illumination, the LV150L is the ideal, cost-effective instrument for a wide variety of production line applications involving opaque workpieces.
Imatek have recently completed the successful installation of an IM10R Impact Test System at the Nagoya site of Tokai Rubber Industries in Japan. The system will be primarily used for understanding and developing the impact and energy absorption characteristics of materials used on vehicles for pedestrian safety applications.
Research and Markets has announced the addition of the "Advanced Techniques for Materials Characterization" report to their offering.
Nowadays, an impressively large number of powerful characterization tech...
The new technical center will provide more local resources and support for this fast paced market. It's an exciting time for us because this is a chance to be even closer to our customers, and show our commitment to customer support after the sal
Appalachian State University's William C. and Ruth Ann Dewel Microscopy Facility has received a $509,620 award from the National Science Foundation to purchase a state-of-the-art transmission electron microscope/scan...
CERAM, a leading provider of slip resistance testing, has become one of a select few companies that can offer fully accredited slip resistance testing on site. The expansion of the company’s ISO 17025 accredited la...
FEI Company (Nasdaq:FEIC), a leading provider of high-resolution imaging and analysis systems, today announced the release of two dedicated scanning electron microscopes (SEMs) and a new software package for automated an...
Dr Graham Rideal, managing director of Whitehouse Scientific, will deliver a paper at Filtech 2009 describing ‘A new method of measuring pore size distributions using multi-modal particle size standards’. The work is being presented as part of the session on Filter Media Characterization and describes a novel technique developed by Graham Rideal and Jamie Storey of Whitehouse Scientific in collaboration with Dr B Schied of BS-Partikel in Germany.
Lambda Photometrics, one of the UK's leading distributors of Lasers, Optics, Fibre Optics, Electronic Instrumentation, Surface Metrology and Machine Vision products, introduce the Fibermetric System powered by the Phenom desktop SEM; a powerful, easy to use automated measurement system for nano and micro fibers.
Philosophers often say that to find the truth one must look below the surface. But for scientists and engineers in a broad range of fields, the surfaces of objects can reveal a wealth of useful information, from the func...
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