Posted in | Materials Processing | Sensors | Surface Analysis

Next generation optical surface profiling

The TopMap whitelight-interferometers, Micro.View and Micro.View+, are used for comprehensive 3D surface characterization regarding surface roughness, texture, and areal evaluation of form parameters with nanometer-scale resolution.

These optical profilers are equipped with microscope objectives and feature CST Continuous Scanning Technology, which uses the entire z-axis as travel range for measurements, thus providing maximum flexibility in sample positioning. Enhancements such as Focus Finder and Focus Tracker simplify usage, while motorized stages ensure that samples remain in focus at all times. Smart Scanning Technology facilitates the measurement of areal topography across all types of surfaces, including those from dark and shiny materials. 

Run time: 2:40

Next generation optical surface profiling | TopMap Micro.View® & Micro.View®+

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