MRS 2011 Fall Meeting Videos

The Evactron plasma decontamination systems from XEI Scientific are used to clean samples or chambers.

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The 8400 Series Hall Effect Measurement System (HEMS) is Lake Shore Cryotronics latest addition to their range of HEMS that are used to characterize the electronic properties of semiconductors. In particular they are used to determine carrier type, density and mobility as well as their hall co-efficient.

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David Lewis form Nanonics Imaging shows us their Multiview 4000 multiprobe SPM system. It can cater for up to 4 independent probes creating a true nano workstation. The open platform design enables integration with optical or scanning electron microscopes as well as Raman microscopes.

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Bruker's CETR-Apex system is a nanomechanical testing system that features easily interchangeable heads allowing it to be able to used as a nano or micro indentation system as well as micro and nano scratch. Denis Koosau from Bruker shows us how easy it is to change a test head in this short video.

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We spoke to Stefan Kaemmer at the 2011 MRS Fall Meeting in Boston and he gave us a run down on their new Innova-IRIS system which combines the Bruker Innova AFM with the Renishaw raman confocal microscope. The system allows you to correlate chemical and topographical information at the same time.

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Are you interested in performing calorimetry experiments quickly?

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The Bruker ContourGT-X8 is their top of the line optical profiler. It uses technology that has been developed and refined to create 3-dimensional maps of sample surfaces.

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Roshan Shetty from Anasys Instruments shows us their new AFM+ platform. This new development has been designed as a modular entry level instrument that combines an atomic force microscope and thermal analysis capabilities. It has been designed so that it can be upgraded to their NanoIR spec at a later date.

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The Dimension Fastscan from Bruker is the fastest AFM on the market. John Thornton takes us for a tour of this instrument pointing out key features and runs a demonstration to illustrate how fast data can be collected. The speed of this instrument make it suited to rapid sampling across large samples and production environments where speed is critical.

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Dr. Olaf Hollricher from Witec shows us their award winning TrueSurface Microscopy system. It uses Raman spectroscopy technology but has advantages over confocal Raman spectroscopy in that it is able to accurately track the surface of the sample and in the process keeping it in focus at all times.

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Brian Crawford from KLA demonstrates their P-6 stylus profilometer that uses contact stylus technology that typically uses a 2µm stylus tip although other options are abvailable.

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The IH15a from Across International is a laboratory sized induction heater suited to melting, welding, and surface heating of materials.

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Bill Henderson from Leica shows us the DCM 3D surface metrology tool. The system features a confocal microscope and interferometer and features LED illumination and CCD detector.

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Leica's Todd Perez shows us their TXP mechanical preparation system and the TIC 3X triple ion beam cutting system.

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