MRS 2010 Fall Meeting Videos

Ben Garland from Zeta Instruments demonstrates their Zeta-20 Optical Profilometer which can measure surface and textural properties of materials such as solar cells, microfluidics, biologicals, etc.

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Dave Shepard from Netzsch Instruments MMC 274 Nexus Multi Module Calorimeter. It is suited to liquids and battery materials. The instrument can employ different modules depending on what type of measurement is required. Modules that can be supplied can perform measurement akin to differential scanning calorimetry (DSC), accelerating rate calorimetry and very fast tracking, to simulate runaway heating.

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The NanoIR system from Anasys Instruments is a unique instrument that combines AFM and IR Spectroscopy. Kevin Kjoller explains how the system works, how they have been able to integrate an atomic force microscope and infrared spectroscope to generate topographical, localised mechanical, thermal and chemical data for polymeric and organic materials.

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The new LensAFM from Nanosurf has been designed to integrate with optical microscopes and profilers, and add AFM capabilities to them. This demonstration shows how easy it is to switching between AFM and optical microscopy/profiler modes.

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The LVEM5 from Delong America is a unique piece of equipment, being the only benchtop TEM on the market.

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Take a quick video tour of the OmegaScope AFM-Raman from AIST-NT. The OmegaScope is based on AIST-NT's Smart-SPM, and features either single or 3 laser Raman capabilities and an objective lens up to 100x magnification.

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The alpha 300R Plus from WITec is a confocal Raman microscope with two scanning systems, a coarse motorized stage for large areas and a piezo stage for fine, sub nanometer adjustments. It is capable of producing 3 dimensional optical and chemical information and features optical components that are all coupled by optical fibres. It is also able to have an AFM added to increase its resolution to the sub-nanometer level.

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Asylum Research has introduced unique technology for characterizing battery materials for their Cypher AFM. Called Electrochemical Strain Microscopy, this technique allows you to look at lithium ion transport capabilities of materials. Sergei Kalinin from Oak Ridge National Laboratory explains how this technique works and Roger Proksch from Asylum Research demonstrates how the Cypher produces data and its relevance to the field of battery materials.

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Sean Gasparovic shows us the Keyence VHX-1000 fully integrated digital microscope system. It includes an optical system designed specifically to work with a CCD, with magnification from 0.1X to 5000X

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Ross Smith from Bruker tells us about the all new AcuityXR measurement mode for optical and surface profilers. Introduced at 2010 MRS Fall Meeting, AcuityXR combines hardware and software to provide resolution beyond the diffraction limit. This allows the optical profiler to image features down to 130nm. Acuity XR is available on Bruker's range of Contour GT optical and surface profilers.

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The Multiview Series from Nanonics Imaging Ltd combines AFM and Raman. The Nanonics can be supplied as an upgrade to an existing Raman system or as a complete system. David Lewis from Nanonics explains how their system works and its advantages and the benefits of being able to determine the chemical structure of the material as well as its topography.

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Celeste Jenkins from Agilent Technologies explains the importance of source measurement units or SMU's for the characterization of electrical properties of materials and devices. They are typically used on materials like silicon-based solar cells.

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The NHT2 Nanoindentation tester from CSM Instruments combines a nanoindenter and AFM in one compact, affordable, easy to use desktop unit. This version has been re-designed and now features liquid compatibility, a wider load range and multi sample capability. The use of two video cameras, proving a side view and a top view of the sample eliminate the need for an optical microscope.

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John Treadgold from Carl Zeiss NTS shows us the main features and specifications of the Sigma VP (Variable Pressure) scanning electron microscope (SEM).

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Brad Dodrill from Lake Shore Cryotronics shows us through one of their cryogenic probe stations.

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The FlexAFM from Nanosurf is a full featured atomic force microscope designed for research applications. It features a modular design, flexure stage which minimizes background movement, decoupled z-piezo and a unique interchangeable nose cone permitting use in air or liquid media, making it suitable for biological samples.

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Mountains Map 6 is the latest generation roughness and texture analysis software from Digital Surf. It is designed to work with instruments such as optical profilometers, confocal microscopes, scanning probe and atomic force microscopes and can deal with samples as large as automotive panels down to AFM size of just a few microns. The latest features of version 6.0 are outlined and a live demonstration of its capabilities provided.

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Jon Shein from Thermo Fisher Scientific demonstrates how their Niton XL3t handheld XRF analyzer can quickly check for lead content/contamination in consumer items.

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Jon Shein from Thermo Fisher Scientific demonstrates how the Niton XL2 handheld XRF analyzer can quickly and easily determine the composition of precious metals like gold jewelry. In the space of less then 2 minutes the Niton XL2 accurately analyze 2 different samples

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Bill Flecky and Andrey Krayev from AIST-NT show us how easy the SmartSPM is to use. It is able to perform scans very quickly, and in the space of just a few minutes we see them set up the instrument and take a series of measurements.

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Jon Shein from Thermo Fisher Scientific runs a demonstration, showing how quickly the Niton XL2 handheld XRF analyzer can be used to determine the composition of stainless steel samples.

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Chris Orsulak from Bruker points out the main features of the ContourGT Optical Profiler and briefly describes how it works.

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Nicholas Randall features and capabilities new Nanotribometer CSM Instruments. It uses similar loadings to an AFM, but can use wear partners with different size and shapes comapred to an AFM probe tip.

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