Mar 7 2014
Aehr Test Systems, a leading supplier of semiconductor test and burn-in equipment, today announced it has received over $1.5 million in follow-on orders for WaferPak full-wafer contactors for its FOX-1 and FOX-15 wafer-level burn-in and test systems.
"We are pleased with the continued activity we are seeing in our WaferPak consumable business," said Carl Buck, vice president of marketing at Aehr Test Systems. "We see our customers doing full-wafer test or burn-in on more and more of their new products. The orders for these WaferPak contactors are for diverse applications, including both automotive and flash memory applications."
"These orders are another indication of the effectiveness of our FOX wafer-level burn-in and test products. These products are differentiated by our proprietary full-wafer burn-in and test technology and WaferPak contactors, which support processing up to 15 wafers in parallel in a single system," said Gayn Erickson, President and Chief Executive Officer of Aehr Test Systems.
The FOX systems, using Aehr Test WaferPak contactors, allow parallel testing of thousands of die on a wafer with only a single touchdown. Aehr Test's FOX family of products is focused on high reliability test needs and long-duration full wafer burn-in and test of products such as automotive ICs, memories and devices with embedded memories, including microcontrollers and smart card devices. The FOX-1 system offers high-throughput single-touchdown sort testing. The FOX-15 system has a capacity of up to 15 WaferPak single-touchdown full-wafer contactors for burn-in and test of state-of-the-art integrated circuits. As each wafer contains thousands of ICs, the throughput and capacity of the systems are quite large and suitable for production as well as reliability qualification applications.
With the increasing popularity of stacked or multi-die packaging, each of the die in the package must be highly reliable, enabling the multi-die package to meet the stringent reliability demands of the automotive and enterprise server manufacturers. Aehr Test's FOX systems provide full wafer contact parallel test and burn-in solutions for the die before they are assembled into the package. This enables the reliability screening to be done on the die before the assembly of the multi-die package, avoiding the costly scrapping of entire stacked or multi-chip packages when only one of the die fails the reliability screen.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic and memory integrated circuits and has an installed base of more than 2,500 systems worldwide. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, capacity needs and opportunities for Aehr Test products in package and wafer level test. Aehr Test has developed and introduced several innovative products, including the ABTSTM and FOX families of test and burn-in systems and the DiePak® carrier. The ABTS system is used in production and qualification testing of packaged parts for both lower-power and higher-power logic as well as all common types of memory devices. The FOX system is a full wafer contact test and burn-in system used for burn-in and functional test of complex devices, such as leading-edge memories, digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of bare die.