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Results 91 - 100 of 583 for Atomic force microscopy
  • What are the Functions of Conductive and Photoconductive AFM?
    Article - 28 Jul 2022
    Conductive and photoconductive atomic force microscopy are variations of atomic force microscopy (AFM). Conductive AFM simply measures the electrical conductivity of materials while photoconductive...
  • How to Assemble an Atomic Force Microscope
    Article - 5 May 2022
    Atomic force microscopy (AFM) is an effective technique for evaluating microscopic surface topography and material parameters of any specimen. AFM microscopes are available in different sizes and...
  • Analyzing Scale of Multi-Asperity Wear with AFM Techniques
    Article - 1 Mar 2022
    This article explores asperity, techniques to measure asperities, and discusses the prediction of wear of multi-asperity interfaces using atomic force microscopes (AFMs).
  • Using AFM to Predict Electrochemical Impedance Spectra
    Article - 4 Feb 2022
    This article focuses on atomic force microscopy, electrochemical impedance spectra, and the interrelation between the two concepts.
  • The Role of AFM in the Progression of Healthcare
    Article - 8 Oct 2019
    The versatility of AFM means that it is helping to understand materials, with molecules, pharmaceuticals and biomaterials used in healthcare being no exception.
  • Applications of AFM
    Article - 5 Sep 2019
    Atomic Force Microscopy (AFM) can now be used to probe several properties of a material. This article discusses the many applications where AFM has become an important imaging and characterization...
  • Exploring Cell Mechanics With AFM
    Article - 5 Feb 2019
    This article discusses how AFM assist in exploring the mechanics of a cell.
  • Combined AFM and Raman with the Multiview System from Nanonics
    Video
    The Multiview Series from Nanonics Imaging Ltd combines AFM and Raman. The Nanonics can be supplied as an upgrade to an existing Raman system or as a complete system. David Lewis from Nanonics...
  • The Smart SPM/AFM from AIST-NT - Ease of Use Demonstration
    Video
    Marshall Bates and Andrey Krayev from AIST-NT demonstrate the ease of use of the AIST SmartSPM/AFM. From loading a sample to starting to take measurements can be completed in 1-2 minutes, at atomic...
  • Camtek FRT Metrology
    Supplier Profile
    Camtek FRT Metrology manufactures 3D surface measurement technology for research and production. Our high-precision measuring instruments are based on SurfaceSensTM multi-sensor concept and are...

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