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Results 71 - 80 of 646 for Afm
  • Nanonics Imaging Ltd.
    Supplier Profile
      Nanonics Imaging is the premier innovator of AFM and NSOM systems in the SPM market. Since its inception in 1997 and throughout the last fifteen years Nanonics have introduced to the SPM...
  • Agilent Technologies New AFM/Raman Spectroscopy System Provides Nanoscale Material Identification and Analysis
    News - 14 May 2013
    Agilent Technologies Inc. has announced the availability of a high-performance AFM/Raman system for life science and materials science applications. The system seamlessly integrates the Agilent...
  • Park Systems Europe
    Supplier Profile
    More than 25 years ago, the foundations of Park Systems were laid at Stanford University, where Dr. Sang-il Park, the founder of Park Systems, worked at Prof. Quate’s group that invented the...
  • The Use of AFM in Archaeology and Paleontology
    Article - 7 Feb 2022
    Atomic force microscopy (AFM) is one of the analytical methods that can provide a non-invasive, non-destructive, and nanometer-scale characterization of archaeological and paleontological samples.
  • NanoAndMore USA
    Supplier Profile
    NanoAndMore USA was founded in 2005 by NanoWorld Holding AG and George McMurtry, formerly a founder and vice president of Quesant Instrument Corporation, one of the oldest AFM manufacturers. The...
  • KLA Instruments™
    Supplier Profile
    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
  • Which AFM Substrates Are Used to Image Small Biological Objects?
    Article - 4 Mar 2022
    This article informs readers regarding the basics of atomic force microscopy, its uses for biological applications, and the different substrates used for AFM imaging of small biological objects.
  • Dimension FastScan Pro for High-Volume Production Environments
    Equipment
    Bruker’s Dimension FastScan Pro system uses an open-access platform, large or several sample holders, and many user-friendly features for high-volume production environments.
  • Unprecedented AFM Image Quality Now Possible Thanks to CNT Probes
    News - 15 Jun 2009
    Carbon Design Innovations, Inc. (C|D|I) today announced the availability of two new atomic force microscope (AFM) probes types with carbon nanotube (CNT) tips. The CCHAR (carbon core high-aspect...
  • Correlative Microscopy and SEM-AFM
    Article - 4 Sep 2018
    Almost all semiconductor devices are formed of heterostructures, which are stacked layers of distinctive materials deposited using distinctive techniques.

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