Discover How to Perform Advanced SEM Sample Preparation for Air-sensitive Materials

This webinar from Thermo Scientific introduces the CleanMill Broad Ion Beam System, which allows for enhanced SEM sample preparation for air-sensitive and traditional materials.

Duration: 1 hour

Watch this webinar on-demand to learn more about Thermo Scientific’s CleanMill Broad Ion Beam System - a complete ion beam polishing solution that generates immaculate surfaces on even the most moisture- and air-sensitive samples.

The webinar outlines how the CleanMill System can help materials scientists in the field of R&D, production quality control (QC) specialists, and failure analysis engineers quickly and effectively finalize various samples for imaging, such as battery materials.

The CleanMill System can help accelerate workflows and allow users to gather key insights.

Benefits of the System

• A wide beam energy range and dedicated low-energy optics provide flexibility and help optimize performance.
• High throughput and consistent, high-quality surface and cross-section preparation to help gather reliable SEM data.
• CleanConnect compatibility and integration with the Thermo Scientific Inert Gas Sample Transfer Workflow for worry-free characterization of air-sensitive materials.

About the Speaker

Dr. Eric Goergen
Senior Product Marketing Manager, Thermo Fisher Scientific

Dr. Goergen first joined Thermo Fisher Scientific eleven years ago as a research scientist and is currently a senior product marketing manager for SEM solutions. He has a Ph.D. in geology and geophysics from the University of Minnesota and over 20 years of experience using electron microscopy for microstructural analysis, EDS, and EBSD applications. He holds multiple patents in EDS acquisition and visualization techniques and deep experience using broad ion beam systems for advanced surface preparation.