Posted in | Software

Phenom Programming Interface - Enhanced Workflow Automation with Scripting

Need more information?

Let us help you with your inquiries, brochures and pricing requirements

Thermo Fisher Scientific – Electron Microscopy Solutions logo.

The Thermo Scientific Phenom Programming Interface (PPI) is an Application Programming Interface (API), which can be used to send commands to a Phenom microscope. 

With PPI, users have access to stage controls, image acquisition and EDX. As a result, users can automate their workflows, increasing throughput. 

Key Features

Customization

Develop tailored scripts for the acquisition and processing of SEM data.

Increased Efficiency

Boost efficiency and save valuable time by implementing automated processes that minimize the user bias.

Specifications

  • PPI connects a PC or laptop to the Phenom SEM
  • Scripts can be written in programming languages such as Python or C#

Other Equipment by this Supplier

3D Roughness analysis with Desktop SEM

3D Roughness analysis with Desktop SEM
Air-Sensitive Sample Protection with CleanMill Broad Ion Beam System

Air-Sensitive Sample Protection with CleanMill Broad Ion Beam System
Automated FIB Serial Sectioning With Enhanced 3D EDS and EBSD Features

Automated FIB Serial Sectioning With Enhanced 3D EDS and EBSD Features
Automated Pore Characterization with Phenom PoroMetric Software

Automated Pore Characterization with Phenom PoroMetric Software
Avizo Software - Imaging Data Analysis for Materials Characterization and Quality Control

Avizo Software - Imaging Data Analysis for Materials Characterization and Quality Control
Axia ChemiSEM

Axia ChemiSEM
Chemical Characterization and In Situ Dynamic Observations with Talos F200i TEM

Chemical Characterization and In Situ Dynamic Observations with Talos F200i TEM
Desktop SEM for High-Performance Imaging and EDS Analysis — Phenom ProX Desktop SEM

Desktop SEM for High-Performance Imaging and EDS Analysis — Phenom ProX Desktop SEM
Desktop SEM with FEG Source for High Brightness Imaging — Phenom Pharos Desktop SEM

Desktop SEM with FEG Source for High Brightness Imaging — Phenom Pharos Desktop SEM
Desktop SEM with High Brightness and Color Navigation Camera — Phenom Pro Desktop SEM

Desktop SEM with High Brightness and Color Navigation Camera — Phenom Pro Desktop SEM
Economical Desktop SEM with Reliable Ease-of-Use Features and Automation — Phenom Pure Desktop SEM

Economical Desktop SEM with Reliable Ease-of-Use Features and Automation — Phenom Pure Desktop SEM
Elemental Mapping (EDX) with Desktop SEM

Elemental Mapping (EDX) with Desktop SEM
Environmental Scanning Electron Microscopy with Prisma E SEM

Environmental Scanning Electron Microscopy with Prisma E SEM
Faster Analysis of Large Samples with Phenom XL G2 Desktop SEM

Faster Analysis of Large Samples with Phenom XL G2 Desktop SEM
FIB-SEM and Laser Ablation - Advanced Material Solutions

FIB-SEM and Laser Ablation - Advanced Material Solutions
Focused Ion Beam Scanning Electron Microscope — Helios Hydra DualBeam

Focused Ion Beam Scanning Electron Microscope — Helios Hydra DualBeam
Gunshot Residue Analysis with Phenom ParticleX GSR Desktop SEM

Gunshot Residue Analysis with Phenom ParticleX GSR Desktop SEM
Helios 5 DualBeam - Advanced S/TEM and APT sample preparation, subsurface and 3D Characterization

Helios 5 DualBeam - Advanced S/TEM and APT sample preparation, subsurface and 3D Characterization
Helios 5 Laser PFIB System

Helios 5 Laser PFIB System
Helios 5 PFIB DualBeam - TEM Sample Preparation, 3D Characterization, and Micromachining

Helios 5 PFIB DualBeam - TEM Sample Preparation, 3D Characterization, and Micromachining
High-Contrast Imaging and Precise Analysis with Talos F200C TEM

High-Contrast Imaging and Precise Analysis with Talos F200C TEM
Highest Mechanical Stability and Imaging Quality With Spectra 300 TEM

Highest Mechanical Stability and Imaging Quality With Spectra 300 TEM
High-Resolution XPS and Imaging for Advanced Surface Analysis

High-Resolution XPS and Imaging for Advanced Surface Analysis
Imaging Automation With Python-Based SEM and FIB SEM Software

Imaging Automation With Python-Based SEM and FIB SEM Software
Maps 3 Software - Electron Microscopy and Cross-Platform Imaging with Advanced Automation

Maps 3 Software - Electron Microscopy and Cross-Platform Imaging with Advanced Automation
Microscale Technical Cleanliness With Phenom ParticleX TC Desktop SEM

Microscale Technical Cleanliness With Phenom ParticleX TC Desktop SEM
More Accurate Chemical Quantification With Talos F200X G2 TEM

More Accurate Chemical Quantification With Talos F200X G2 TEM
Phenom FiberMetric Software - Precise Fiber Analysis on Phenom Desktop SEMs

Phenom FiberMetric Software - Precise Fiber Analysis on Phenom Desktop SEMs
Phenom ParticleX AM - Desktop SEM for Large-Scale Additive Manufacturing Analysis

Phenom ParticleX AM - Desktop SEM for Large-Scale Additive Manufacturing Analysis
Phenom ParticleX Battery Desktop SEM - Battery Production and Analysis

Phenom ParticleX Battery Desktop SEM - Battery Production and Analysis
Phenom ParticleX Steel Desktop SEM

Phenom ParticleX Steel Desktop SEM
Precision Particle Characterization with Desktop SEM

Precision Particle Characterization with Desktop SEM
Revealing Natural States of Materials with Environmental Scanning Electron Microscopy (ESEM)

Revealing Natural States of Materials with Environmental Scanning Electron Microscopy (ESEM)
Scios 2 DualBeam - Ultra-High Resolution Imaging and 3D Characterization

Scios 2 DualBeam - Ultra-High Resolution Imaging and 3D Characterization
Serial Block-Face Imaging With Volumescope 2 SEM

Serial Block-Face Imaging With Volumescope 2 SEM
Specialized Solution for Asbestos Analysis on Phenom Desktop SEMs Featuring Integrated EDS Detectors

Specialized Solution for Asbestos Analysis on Phenom Desktop SEMs Featuring Integrated EDS Detectors
Spectra 200 TEM - High-Throughput Microscopy for Materials Science

Spectra 200 TEM - High-Throughput Microscopy for Materials Science
Spectra Ultra S/TEM

Spectra Ultra S/TEM
Spectroscopy for Beam-Sensitive Materials With Spectra Ultra STEM

Spectroscopy for Beam-Sensitive Materials With Spectra Ultra STEM
Streamlining Imaging Workflow for Core Facilities with Athena Software

Streamlining Imaging Workflow for Core Facilities with Athena Software
Streamlining TEM and STEM Sample Preparation with AutoTEM 5 Software

Streamlining TEM and STEM Sample Preparation with AutoTEM 5 Software
Talos F200S G2 TEM - High-Resolution Characterization and EDS Analysis

Talos F200S G2 TEM - High-Resolution Characterization and EDS Analysis
Talos L120C G2 (S)TEM - Versatile 2D and 3D Visualization for Beam-Sensitive Samples

Talos L120C G2 (S)TEM - Versatile 2D and 3D Visualization for Beam-Sensitive Samples
Thermo Scientific Apreo 2 SEM for Materials Science

Thermo Scientific Apreo 2 SEM for Materials Science
Thermo Scientific™ Nexsa™ G2 Surface Analysis System

Thermo Scientific™ Nexsa™ G2 Surface Analysis System
Velox Software for Advanced STEM and TEM Material Imaging and Analysis

Velox Software for Advanced STEM and TEM Material Imaging and Analysis
Verios 5 XHR SEM - High Material Contrast for Nanomaterial Characterization

Verios 5 XHR SEM - High Material Contrast for Nanomaterial Characterization

Terms

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.

Provide Feedback