Introducing the FEI Phenom Personal Electron Microscope

Validating samples is a time consuming and expensive process when trying to track down defects and reasons for semiconductor failures. Optical microscopes were used to examine samples after each polishing stage, but they do not have the resolution to detect the small defects that are now being produced. With its small footprint, higher resolution and comparable price, the FEI Phenom personal electron microscope is the ideal alternative. It also offers faster sample analysis and imaging compared to many other scanning electron microscopes.

Run time - 2:42min

With increasing demands and faster sample turn around required from from testing labs the FEI Phenom personal electron microscope is the ideal instrument for your lab. Bridging the gap between light microscopy and high end scanning electron microscopes, the FEI Phenom personal electron microscope features a compact desktop format, reasonable price, magnification range from 10 to 20,000 times and a resolution of 30nm. It also is extremely easy meaning anyone can use it, leading to rising productivity.

Run time - 2:42min