The FEI Phenom Personal Electron Microscope-From Research Lab to Teaching Environment

Validating samples is a time consuming and expensive process when trying to track down defects and reasons for semiconductor failures. Optical microscopes were used to examine samples after each polishing stage, but they do not have the resolution to detect the small defects that are now being produced. With its small footprint, higher resolution and comparable price, the FEI Phenom personal electron microscope is the ideal alternative. It also offers faster sample analysis and imaging compared to many other scanning electron microscopes.

Run time - 2:42min

 

Staff at NCSU talk about how they have taken the FEI Phenom personal electron microscope out of the dedicated research lab and brought it out into the teaching environment. It's versatility and ease of use mean that it can be used by operators with even limited experience.

The FEI Phenom is priced at about the same level as a high end optical microscope but offers a much greater depth of field. is the ideal instrument for your lab.

Run time - 3:15 min

Phenom as Research Tool NCSU

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