Mar 14 2013
The PANalytical team will demonstrate the advanced capabilities of their range of unique analytical solutions at Pittcon 2013, in Philadelphia, March 17-21.
In their newly designed booth #741, PANalytical will challenge conferees to pit themselves against the Epsilon 3 XL in a contest to correctly identify local Pennsylvanian beers, while in a complementary demonstration the ASD LabSpec4 NIR system will identify and measure the quality of different sorts of barley. PANalytical will also showcase the Empyrean X-ray diffraction (XRD) system, the X’Pert Powder XRD system, the Axios wavelength dispersive X-ray fluorescence (WDXRF) system and the Eagon 2 fusion sample preparation machine.
This year’s PANalytical challenge promises to be a highlight of the conference, as PANalytical invites conferees to taste and identify a range of local beers, which will then be analyzed by the powerful Epsilon 3 XL X-ray fluorescence (XRF) spectrometer. Pieter de Groot, Corporate Marketing Director commented: “The system also features the new and innovative Stratos software that is able to analyze more than 16 layers, depending on their thickness and composition. The upgraded FingerPrint software provides a fully automated method with advanced spectrum processing and state-of-the-art correction and quantification algorithms”. FingerPrint software allows the Epsilon 3 XL to identify the beers and demonstrate its high performance in food testing applications, as well as areas such as petroleum, cement production and pharmaceuticals. With a new high-performance ceramic X-ray tube, the Epsilon 3 XL provides non-destructive quantitative analysis across the full range of elements, in concentrations from 100% down to ppm levels, with little or no sample preparation. This tasting challenge will be accompanied by the analysis of barley on the ASD LabSpec4 NIR system, which offers exceptional sensitivity in 0.1 second spectrum collection time.
Additionally on booth #741, PANalytical will exhibit the Empyrean XRD system, winner of 2011 R&D 100 Award, complete with the advanced PIXcel3D 2x2 detector and the new ScatterX78 for nanomaterials analysis. This addition to the system allows quick and sensitive small-angle X-ray scattering (SAXS) measurements, while the wide-angle X-ray scattering (WAXS) signal to angles of up to 78 degrees provides information about atomic order.
Pieter de Groot commented, “We hope everyone will come along to take on our beer taste test challenge, and see if they can beat the Epsilon 3 XL. We are very excited to have the opportunity to demonstrate the advanced capabilities of our extensive range of instruments. XRF, XRD and NIR are exceptionally powerful technologies with a whole host of applications, and together with our specially designed software packages they deliver unmatched performance.”