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Results 231 - 240 of 465 for Semiconductor manufacturing equipment
  • Article - 27 Feb 2002
    If the structure of carbon fullerenes and buckytubes is not fascinating enough, add their amazing properties. Many of these stem from their defect free structure. Mechanical, thermal and electrical...
  • Article - 27 Feb 2002
    The addition of buckytubes to polymer matrices can introduce fascinating mechanical, electrical and thermal properties as well as opening the door to a range of new applications. These new...
  • Article - 27 Feb 2002
    Buckytubes are a type of fullerene or perfect carbon structure. The discovery, evolution and structure of single and multiwall buckytubes are considered. Advantages over other materials including...
  • Article - 16 Feb 2002
    The only material that is practically used for electron emitters is tungsten. Although there are other electropositive metals that yield higher emission rates, tungsten has an extremely low vapor...
  • Article - 23 Nov 2001
    Materials with grain sizes in the order of a billionth of a meter are called nanomaterials, or nanocrystalline materials, which can be used for a range of structural and non-structural applications.
  • Article - 26 Jul 2001
    This article provides details on how aluminium nitride is produced, key properties and its applications, including microelectronics.
  • Article - 20 Jul 2001
    Gold is most widely known as a precious metal due to its high lustre and chemical inertness. It is also used for coinage, ornaments, jewellery, gilding, textile industry, radiation control,...
  • Article - 5 Jun 2001
    Porous silicon has semiconducting properties as well as displaying bioactivity. This makes it potentially a useful material for electronic implant devices. Properties and production are described.
  • Article - 13 Feb 2001
    This article discusses magneto-strictors, their applications and capaiblities.
  • Article - 15 Jul 2021
    Sheaumann's new and expanded cleanroom is capable of conducting all semiconductor activities, be it testing, reliability examinations or wafer growth analysis.

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