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Results 261 - 270 of 1653 for Measuring devices
  • Article - 27 Jun 2002
    X-Ray fluorescence is probably best known for compositonal analysis. However, it can also be used as a form of non-destructive testing for measuring coating thickness. The basic system, technique and...
  • Article - 18 Dec 2001
    Gallium is present as a trace element in germanite, sphalerite, diaspore, coal, and bauxite. Although this metal occurs naturally in approximately the same amount as lead, it is extensively dissipated...
  • Article - 30 Nov 2001
    Micro-impact testing is a repetitive technique for evaluating coating adhesion, toughness and resistance to erosive wear. It is able to simulate actual wear conditions more closely than other...
  • Article - 23 Jul 2001
    Uranium is a heavy, silver-white metal resembling nickel. It is malleable, ductile, slightly paramagnetic and pyrophoric when finely divided. Its main uses are as a nuclear fuel, radioactive isotope...
  • Article - 20 Jul 2001
    Gold is most widely known as a precious metal due to its high lustre and chemical inertness. It is also used for coinage, ornaments, jewellery, gilding, textile industry, radiation control,...
  • Article - 7 May 2001
    Elastic electret films of electromechanical film (EMFi) have the ability to sense the slightest touch, change their thickness accordingly to an external voltage and produce sound in the process....
  • Article - 3 Apr 2001
    Parylenes (or parxylylenes)are a family of polymers that can be used as a protective coating. They can be used for protection of artefacts as well as in the electronics and medical industries.
  • Article - 14 Feb 2001
    There are materials that exhibit a rapid rise in resistivity when heated above the Curie Temperature. Generally ceramics with a titanate structure, they are used in temperature control applications.
  • Article - 4 Oct 2024
    Following ISO 20236 standards ensures accurate TNb analysis for water quality monitoring.
  • Article - 14 May 2020
    This article details how the mapping of the work function of a damaged solar cell using XPS.

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