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Results 421 - 430 of 4208 for Microscopes
  • Sonix, Inc.
    Supplier Profile
    Sonix™ manufactures and markets 2 primary product lines - Scanning Acoustic Microscopes (SAM), and Non-destructive Imaging Systems (NDT). The scanning acoustic microscope...
  • Independent Polymer Technology - Ipolytech
    Supplier Profile
    Independent Polymer Technology Ltd. or Ipolytech provide consultancy, testing and analysis services to material suppliers, converters and all end user sectors. Based in the UK with extensive testing...
  • Kratos Analytical, Ltd.
    Supplier Profile
    For the last 46 years Kratos Analytical has provided state-of-the-art spectrometers for surface analysis and we are committed to continuing with development of leading technologies. As we approach our...
  • Image Metrology A/S
    Supplier Profile
    Image Metrology was founded in 1998. Today we are a world wide leading supplier of image processing software for "nano-microscopy". Our mission is to provide our customers with...
  • Using Vibration Control to Improve Your Microscope's Performance
    Article - 20 May 2024
    This article discusses the reasons why vibration control is necessary for active isolation systems.
  • How is the Attainable Spatial Resolution of FTIR Microscopes Determined?
    Article - 6 Nov 2023
    This article explores how the attainable spatial resolution of FTIR microscopes can be determined via the optical design as well as the infrared performance of infrared microscopes.
  • Pioneering Vibration Control: Revolutionizing Scanning Electron Microscopes
    Article - 11 Oct 2024
    This article talks about how vibration control can revolutionize Scanning Electron Microscopes performance with an active Piezoelectric Floor Platform.
  • Simplifying Manufacturing Processes with Augmented Reality Microscopes
    Article - 22 Aug 2022
    This article from Evident IMS outlines how augmented reality microscopes can be used to simplify complex manufacturing processes.
  • How to Assemble an Atomic Force Microscope
    Article - 5 May 2022
    Atomic force microscopy (AFM) is an effective technique for evaluating microscopic surface topography and material parameters of any specimen. AFM microscopes are available in different sizes and...
  • Analyzing Thin Crystals with an Electron Microscope
    Article - 5 Apr 2022
    Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults.

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