The NANOS delivers integrated energy dispersive spectroscopy (EDS) for quick elemental analysis together with high-quality SEM imaging at a low total cost of ownership. It is made to be simple to install, operate, and maintain.
Making SEM Accessible for Anyone, Everywhere
The NANOS is a versatile and reasonably priced tabletop scanning electron microscope (SEM). It is designed with cutting-edge technology to provide rapid and high-quality SEM images and elemental analysis. Its durable and contemporary design makes it ideal for research and development, educational and industrial applications.
Image Credit: Semplor
- Configuration: The NANOS is delivered with BSD, SED, integrated EDS, and a Eucentric tilt stage.
- Cost of ownership: The NANOS has been fabricated to keep the ownership cost lower than any benchtop SEM currently available.
- Design: The NANOS has a robust modern design and is engineered using the latest materials and components.
- Ease of use: In BASIC mode, the NANOS will produce outcomes in a short period of time, irrespective of experience. ADVANCED mode offers additional functionality for elaborate analysis.
- Robust: With outstanding stability and a compact footprint, the architecture of the NANOS ensures it can be used in non-laboratory environments.
- Servicing: The NANOS design enables simple access for maintenance and upgrades, which could be completed at the user’s premises.
Iconic Dutch Design
Designed and manufactured in the Netherlands, the NANOS is well-regarded for its reliability, quality, and user-friendliness.
Image Credit: Semplor
Image Credit: Semplor
Image Credit: Semplor
Image Credit: Semplor
Image Credit: Semplor
Image Credit: Semplor
Key Features
- 1–20 kV Acceleration voltage
- Easy to Use
- Low Service Costs
- High-Performance SE and 4 Quad BSE Detectors
- EDX–Spot Analysis and Element Mapping
- Low Vacuum Capability
- Motorized XY Stage and Eucentric Tilt
- Filament Performance Optimization
Specifications
Source: Semplor
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| SOFTWARE |
Optical |
Magnification range: 2 – 12x |
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SEM |
Magnification range: 50 - 200.000x |
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Resolution |
<10 nm |
| ILLUMINATION |
Optical |
Bright field |
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SEM |
Optimized thermionic source (tungsten) |
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Acceleration voltages |
Default: 1, 2, 5, 7, 10, 15 & 20 kV |
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Adjustable range between 1 & 20kV |
| DETECTOR |
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Secondary electron detector (SED) |
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Backscattered electron detector (BSD) – 4 quadrant |
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Energy Dispersive Spectroscopy detector (EDS) – integrated |
| DIGITAL IMAGE DETECTION |
Optical |
Color navigation camera |
| IMAGE FORMATS |
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JPEG, TIFF, PNG, BMP |
| USER INTERFACE |
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Communication, imaging and analysis use a single monitor with control via a wireless mouse & keyboard |
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Remote control (e.g. iPad) enabled |
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Basic & advanced modes |
| DATA STORAGE |
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Network, USB, workstation |
| SAMPLE STAGE |
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Eucentric tilt stage (-15 up to +40 ̊) |
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Computer-controlled motorized X, Y: 25 x 25 mm |
| SAMPLE SIZE |
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25 mm diameter pin stub |
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60 mm diameter round disk |
| EDS SPECIFICATIONS |
Detector type |
Silicon Drift Detector (SDD), thermo-electrically cooled |
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Detector active area |
30 mm2 |
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Energy resolution |
@ Mn Kα < 133 eV |
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Max. input count rate |
300,000 cps |
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Hardware integration |
Fully embedded |
| SOFTWARE |
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Integrated in NANOS user interface |
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EDS analysis and mapping |
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Export functions |
| SYSTEM SPECIFICATIONS |
Imaging module |
280 (w) x 630 (d) x 550 (h) |
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Weight |
60 kg |
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Pumps |
Turbo molecular pump with oil free membrane pre-vacuum pump |
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Vacuum modes |
High vacuum SEM (conventional SEM), and low vacuum 0.4 mbar (low vac SEM) |
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Controlled vacuum levels via the User Interface |
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Workstation |
Preconfigured All-in-One PC with a 27” monitor.
SEM imaging and EDS Analysis software installed |
Eucentric Stage
The Eucentric Stage seamlessly incorporated within the NANOS represents a truly unique feature that comes standard with each unit. It allows for smooth motorized XY movements, effortlessly manageable through the User Interface.
When in SEM mode, adjusting the specimen's tilt is a straightforward manual operation of the stage. This eucentric design ensures that the sample remains in focus, removing the requirement for interim adjustments in SEM settings. The User Interface accurately indicates the tilt angle, allowing samples to be tilted at angles of up to 55 degrees.
Elemental Analysis
The Energy Dispersive X-Ray (EDX) Silicon Drift Detector (SDD) is fully incorporated into the NANOS. The operator can choose EDX Point Analysis or activate Elemental Mapping using the User Interface.
Electron Detectors
Both a Secondary Electron Detector (SED) and a Back Scattered Electron Detector (BSD) are included with the NANOS as standard.
The BSD is a 4-quadrant detector with entirely independent portions that are configurable. It offers topographical or compositional detail from the sample, as well as images with a “shading effect” by highlighting the surface from several directions.
Experience the NANOS
Image Credit: Semplor