Posted in | Materials Testing and Characterisation

Nanometrics’ Imperia Photoluminescence Imaging System Detects Yield-Killing Defects

This video demonstrates the functioning of Imperia photoluminescence (PL) imaging system from Nanometrics. This PL system uses its unique optical design technology to detect and classify yield-killing defects from nuisance defects, with the additional benefit of simultaneous PL production monitoring. It combines MOCVD reactor yield and PM schedules to reduce fab space use and cassette handling time. The Imperia benefits a wide range of applications within material characterization, and provides advantages from both commercial and technical perspectives by enhancing the process and saving significant amount of costs.

Run Time – 2:08min

The Imperia Photoluminescence (PL) Imaging System from Nanometrics

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