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  • Equipment
    The Mega II is an efficient, automated closed loop, solvent regenerative, electronic assembly and parts cleaning system with quantitative ionic detection, removal and statistical process control...
  • Equipment
    This sophisticated, flexible wafer metrology system combines a MicroEpsilon profilometer with a high-performance, high-resolution vision system and laser interferometers to detect and measure...
  • Equipment
    This single unit construction Line Boring Machine has all the features to do case goods and framework, furniture fittings and 32mm line boring. The fully adjustable boring head can drill vertical or...
  • Equipment
    Electrical characterisation tool for mapping of bricks (or wafers) with mea- surement times of less than four minutes for a 500 mm brick at 1 mm resolution. Completely touch free measurements.
  • Equipment
    MaxMile EpiEL system is a virtual LED device fabrication & characterization system which can be used to measure LED device parameters directly on epiwafers. Without any costly and time-consuming...
  • Equipment
    Improve the reliability and throughput of your robotic wafer handling systems with the next generation wafer mapping sensors from MultiMetrixs. The most technically advanced and cost effective range...
  • Equipment
    For applications requiring large evaporation materials inventory (e.g. multiple or thick layers, extended throw distances) the Model 295 Source provides a wide range of crucible sizes including...
  • Equipment
    The CAMECA NanoSIMS 50 is a unique ion microprobe optimizing SIMS analysis performance at high lateral resolution. It is based on a coaxial optical design of the ion gun and the Secondary ion...
  • Equipment
    Andor’s Newton CCD and EMCCD spectroscopy detectors have been designed specifically for fast and low-light spectroscopic applications.
  • Equipment
    This page details the capabilities of the iKon-L 936, a large area imaging CCD detector from Andor Technology.

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