The LabRAM Odyssey Nano is a completely integrated system based on SmartSPM cutting-edge scanning probe microscope and LabRAM Odyssey completely automated Raman micro-spectrometer.
LabRAM Odyssey Nano provides full automation, broad compatibility, and exceptional performance.
The LabRAM Odyssey Nano combines ease of use and extreme flexibility for the most demanding applications. With capabilities from deep UV to infrared, high spectral resolution, and an extended set of options and accessories, the LabRAM Odyssey Nano is perfectly suited to perform in any research areas.
Features
Multi-Sample Analysis Platform
Macro, micro, and nano size measurements can be performed on the same platform.
Ease-of-Use
Entirely automated operation; begin measuring in minutes rather than hours.
True Confocality
High spatial resolution, automated mapping phases, and complete microscope visualization capabilities are all available.
High Collection Efficiency
Top-down and oblique Raman detection for improved resolution and throughput in co-localized and Tip-Enhanced measurements (Raman and Photoluminescence).
High Spectral Resolution
Optimal spectral resolution performance, numerous gratings with automatic switching, and Raman and PL spectral range analysis.
High Spatial Resolution
Tip Enhanced Optical Spectroscopies (Raman and PhotoLuminescence) provide nanoscale spectroscopic resolution (down to 10 nm).
Multi-Technique/Multi-Environment
Numerous SPM modes are available, including AFM, conductive and electrical modes (cAFM, KPFM), STM, liquid cell and electrochemical environment, and chemical mapping via TERS/TEPL.
Full control of the two instruments through one workstation and powerful software control, SPM and spectrometer can be operated simultaneously or independently.
Robustness/Stability
AFM scanners with high resonance frequencies operate far away from the noise. High performance is attained without the need for active vibration isolation.
Specifications
SmartSPM Scanner and Base
- Sample scanning range: 100 µm × 100 µm × 15 µm (±10%)
- Scanning type by sample: XY non-linearity 0.05 %; Z non-linearity 0.05 %
- Resonance frequency: XY: 7 kHz (unloaded); Z: 15 kHz (unloaded)
- Noise: 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on; 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off; <0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth
- Sample positioning: Motorized sample positioning range 5 × 5 mm
- Sample size: Maximum 40 × 50 mm, 15 mm thickness
- X, Y, Z movement: Digital closed loop control for X, Y, Z axes; Motorized Z approach range 18 mm
- Positioning resolution: 1 µm
AFM Head
- Laser wavelength: 1300 nm, non-interfering with spectroscopic detector
- Alignment: Completely automated cantilever and photodiode alignment
- Registration system noise: Down to <0.1 nm
- Probe access: Unrestricted access to the probe for additional external manipulators and probes
SPM Measuring Modes
Contact AFM in air/(liquid optional); Semicontact AFM in air/(liquid optional); Non-contact AFM; Force Modulation; Phase imaging; Lateral Force Microscopy (LFM); Magnetic Force Microscopy (MFM); Conductive AFM (optional); Kelvin Probe (Surface Potential Microscopy, SKM, KPFM); Force curve measurement; Capacitance and Electric Force Microscopy (EFM); Nanolithography; Nanomanipulation; STM (optional); Piezo Response Force Microscopy (PFM); Photocurrent Mapping (optional); Volt-ampere characteristic measurements (optional).
Spectroscopy Modes
- Confocal Raman, Fluorescence, and Photoluminescence imaging and spectroscopy
- Tip-EnhancedPhotoluminescence (TEPL)
- Near-field Optical Scanning Microscopy and Spectroscopy (NSOM/SNOM)
- Tip-Enhanced Raman Spectroscopy (TERS) in AFM, STM, and shear force modes
Conductive AFM Unit (Optional)
Current Range: 100 fA ÷ 10 µA; 3 current ranges (1 nA, 100 nA, and 10 µA) switchable from the software
Optical Access
Capability to use top and side plan apochromat objective simultaneously: Up to 100×, NA = 0.7 from top or side; Up to 20× and 100× concurrently
Piezo objective scanner with closed loop for super stable long-term spectroscopic laser alignment: Range 20 µm × 20 µm × 15 µm; Resolution: 1 nm
Spectrometer
Completely automated high resolution LabRAM Odyssey micro-spectrometer, capable of functioning as a standalone micro-Raman microscope.
- Wavelength range: 50 cm-1 to 4000 cm-1 or down to 10 cm-1 with Ultra Low Frequency (ULF) filter option
- Optical design: Achromatic spectrograph and achromatic coupling optics
- Gratings: Selection of gratings from 150 g/mm to 3600 g/mm; two gratings on the computer-controlled turret, kinematically mounted and easily exchangeable
- Automation: Fully motorized, software-controlled operation
Detection
Full range of CCD detectors, EMCCDs and InfraRed detectors: InGaAs array, single channel extended InGaAs, InSb, CdTe.
Laser Sources
- Typical wavelength: 532 nm, 638 nm, 785 nm
- Wavelengths: Full range of wavelengths from DUV (229 nm) to IR (up to 2.2 µm)
- Automation: Completely automated laser and filter switching for up to three simultaneous lasers; Laser polarization selection and spectral analyzer options for all wavelengths
Software
Full-featured SPM, spectrometer, and data acquisition control, spectroscopic and SPM data analysis and processing suite, including spectral fitting, deconvolution, and filtering, optional modules include univariate and multivariate analysis suite (PCA, MCR, HCA, DCA), particle detection, and spectral search functionality.