Posted in | EDS

Introduction to Electron Backscatter Diffraction (EBSD)

From Oct 3 2023

Although electron backscatter diffraction (EBSD) was first discovered by Kikuchi in 1928, its potential for microstructural characterization became fully realized only after the technique was automated in 1991. EBSD, a scanning electron microscopy (SEM)-based method, enables the quantification and visualization of the crystallographic features of a polycrystalline material’s microstructure with point-specific precision. Today, EBSD systems are widely used in materials characterization laboratories around the globe.

This webinar will provide an introduction to the EBSD technique, exploring the relationship between diffraction physics and crystallography. Additionally, it will highlight various applications of EBSD in materials science, engineering, and earth sciences.

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