Posted in | EDS

Addressing EBSD Indexing Challenges with Spherical Indexing

From Sep 28 2023

Traditionally, electron backscatter diffraction (EBSD) patterns have been indexed in OIM Analysis™ using the Hough Transform to detect bands in the patterns, combined with various band triplet indexing methods. While this approach is robust, it struggles with low-quality patterns and is limited in angular resolution, making it challenging to resolve pseudosymmetry or differentiate between difficult phases.

Dictionary indexing has emerged as a promising alternative for improved indexing of low-quality patterns. OIM Analysis™ v9 introduces significant advancements over v8, incorporating two key developments: (1) spherical indexing, which involves back-projecting experimental patterns onto a sphere for cross-correlation with dynamically simulated diffraction patterns, and (2) real-space refinement, a localized non-linear optimization approach to enhance crystal orientation accuracy.

This webinar will provide an overview of these new features and demonstrate their application to challenging samples, including heavily deformed materials, rough surfaces, weak diffraction patterns, TKD experiments, phases with pseudosymmetry, and cases requiring high angular resolution. The advantages and limitations of these tools within OIM Analysis™ will also be discussed.

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