EDAX has expanded its Electron Backscatter Diffraction (EBSD) product lineup with several new innovations. The Velocity™ Ultra, the latest addition to the Velocity EBSD Camera Series, has become the world’s fastest EBSD detector, achieving indexing speeds of up to 6,700 points per second. This high-speed, low-noise CMOS detector is ideal for applications where rapid results are essential, such as dynamic in-situ experiments and 3D EBSD characterization. It also delivers robust performance for both routine and complex sample analysis.
Additionally, EDAX has introduced the next generation of its industry-leading OIM Analysis™ software. Designed to accommodate the faster acquisition speeds enabled by the Velocity detectors, OIM Analysis v9 features significant performance enhancements, including optimized orientation math calculations, expanded multi-threading for modern multi-core PCs, and improved data input/output routines.
The OIM Matrix module, which uses simulated dynamical diffraction patterns for enhanced pattern indexing, has also been updated. A new technique, Spherical Indexing, projects experimental EBSD patterns onto a spherical surface for comparison with a simulated master pattern. This approach offers better indexing accuracy compared to traditional Hough-based methods and significantly improves speed over the current Dictionary Indexing approach.
In this webinar, we will showcase the features and performance of the Velocity Ultra, OIM Analysis v9, and Spherical Indexing. Practical results and the unique benefits these advancements offer to users will also be discussed.