An Overview of the Principles of SEM and EDS

This seminar's primary focus is to explain the fundamentals of scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS) and their associated benefits. It should improve understanding of the importance of SEM and EDS in a microscopist's lab.

Watch this seminar to learn more about:

• The basis of and benefits of SEM
• SEM Electron Optics and Imaging
• Low Vacuum mode
• Principles of EDS
• When to consider SEM/EDS analysis
• Quantitative Analysis
• SEM Specimen Preparation

Image Credit: JEOL USA, Inc.

About the Presenters

Presenter: David Edwards, Senior Applications Specialist

With 30 years of experience in SEM, David Edwards has contributed to advancements in novel detector technologies for SEM applications. He is an active member and affiliate of the Organization of Scientific Area Committees for Chemistry and Instrumentation. David also brings 12 years of experience as an SEM and EDS instructor to this presentation.

Q&A:

• Benjamin Muller, Applications Specialist
• David Edwards, Senior Applications Specialist