Posted in | Microscopy

Introducing the GRAND ARM™2: A High Performance Analytical S/TEM

JEOL proudly introduces the JEM-ARM300F2 GRAND ARMTM2, the latest product in its Atomic Resolution analytical Microscope (ARM) series.

This system includes innovative features alongside proven technologies essential to the ARM family of instruments. This makes the GRAND ARM2 the best pick for all aberration-corrected electron microscopy requirements.

This webinar explores:

  • COSMO Auto-tuning
  • Dual, large-area SDDs
  • Field-proven aberration-corrected S/TEM
  • Hybrid HAADF detector with improved S/N and dedicated ABF detector
  • JEOL designed Cs Correctors
  • Mitigation of environmental effects
  • New cold field emission gun
  • New pole piece design yields increased EDS solid angle without sacrificing resolution
  • The GRAND ARM 2 40-300 kV Atomic Resolution TEM
  • Ultimate functionality

 

 

Image Credit: JEOL USA, Inc.

About the Presenters

Dr. Patrick Phillips earned a PhD in Materials Science and Engineering from Ohio State University in 2012. He joined JEOL USA in 2016 after being appointed a research assistant professor at the University of Illinois Chicago. His past research projects and latest interests include Cs-Corrected STEM/EELS/EDS of 2D structures, battery materials, metals, and oxides.

Dr. Thomas Isabell is a crucial contributor to introducing the JEOL ARM series TEMs and CryoARM TEMs. Before joining JEOL in 2003, he was involved in business development at EmiSpec in Tempe, Arizona, and applications support at Fischione Instruments in Export, Pennsylvania. He has a B.S. in Materials Science and Engineering (University of Minnesota) and a Ph.D. in the same subject (Northwestern University).

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